Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Tobias Manthey
  • Janosch Graue
  • Philip Kuhne
  • Jens Friebe

External Research Organisations

  • University of Kassel
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Details

Original languageEnglish
Title of host publication2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion
Subtitle of host publicationSPEEDAM
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages782-787
Number of pages6
ISBN (electronic)9798350387599
ISBN (print)979-8-3503-8760-5
Publication statusPublished - 2024
Event2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion, SPEEDAM 2024 - Napoli, Italy
Duration: 19 Jun 202421 Jun 2024

Abstract

Photovoltaic modules with bypass diodes have been state of the art for years. In addition, optimizers or microinverters can be used as power electronics directly connected to the module to increase energy yield in certain installation scenarios. This paper addresses the replacement of bypass diodes with module-integrated power electronics while maintaining the protective function for the PV cells by means of a basic PV voltage measurement of a half cell photovoltaic module equipped with mono PERC cells in various irradiance and shading scenarios. A concluding comparison of the energy yield between a PV module with bypass diodes and the defined measures of the integrated hardware is presented.

Keywords

    bypass diodes, global irradiance, hot spots, partial shading, PV microinverter, PV module

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters. / Manthey, Tobias; Graue, Janosch; Kuhne, Philip et al.
2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion: SPEEDAM. Institute of Electrical and Electronics Engineers Inc., 2024. p. 782-787.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Manthey, T, Graue, J, Kuhne, P & Friebe, J 2024, Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters. in 2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion: SPEEDAM. Institute of Electrical and Electronics Engineers Inc., pp. 782-787, 2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion, SPEEDAM 2024, Napoli, Italy, 19 Jun 2024. https://doi.org/10.1109/SPEEDAM61530.2024.10609173
Manthey, T., Graue, J., Kuhne, P., & Friebe, J. (2024). Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters. In 2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion: SPEEDAM (pp. 782-787). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SPEEDAM61530.2024.10609173
Manthey T, Graue J, Kuhne P, Friebe J. Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters. In 2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion: SPEEDAM. Institute of Electrical and Electronics Engineers Inc. 2024. p. 782-787 doi: 10.1109/SPEEDAM61530.2024.10609173
Manthey, Tobias ; Graue, Janosch ; Kuhne, Philip et al. / Yield and Hot-Spot Analysis for Replacing Bypass Diodes with PV Module-Integrated Microinverters. 2024 International Symposium on Power Electronics, Electrical Drives, Automation and Motion: SPEEDAM. Institute of Electrical and Electronics Engineers Inc., 2024. pp. 782-787
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