Van der Waals forces and composition of isolated GaNAsM-clusters

Research output: Contribution to journal › Article › Research › peer review

Authors

  • M. Sakurai
  • S. Schlecht
  • J. Woenckhaus
  • R. Schäfer
  • J.A. Becker

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Details

Original languageUndefined/Unknown
JournalZeitschrift für Physikalische Chemie
Publication statusPublished - 1996

Cite this

Van der Waals forces and composition of isolated GaNAsM-clusters. / Sakurai, M.; Schlecht, S.; Woenckhaus, J. et al.
In: Zeitschrift für Physikalische Chemie, 1996.

Research output: Contribution to journal › Article › Research › peer review

Sakurai M, Schlecht S, Woenckhaus J, Schäfer R, Becker JA. Van der Waals forces and composition of isolated GaNAsM-clusters. Zeitschrift für Physikalische Chemie. 1996. doi: 10.1524/zpch.1996.193.part_1_2.109
Sakurai, M. ; Schlecht, S. ; Woenckhaus, J. et al. / Van der Waals forces and composition of isolated GaNAsM-clusters. In: Zeitschrift für Physikalische Chemie. 1996.
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@article{145c62fbc26b415cb6a92b65b6c6850c,
title = "Van der Waals forces and composition of isolated GaNAsM-clusters",
author = "M. Sakurai and S. Schlecht and J. Woenckhaus and R. Sch{\"a}fer and J.A. Becker",
year = "1996",
doi = "10.1524/zpch.1996.193.part_1_2.109",
language = "Undefined/Unknown",
journal = "Zeitschrift f{\"u}r Physikalische Chemie",
issn = "0044-3336",
publisher = "Walter de Gruyter GmbH",

}

Download

TY - JOUR

T1 - Van der Waals forces and composition of isolated GaNAsM-clusters

AU - Sakurai, M.

AU - Schlecht, S.

AU - Woenckhaus, J.

AU - Schäfer, R.

AU - Becker, J.A.

PY - 1996

Y1 - 1996

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-0009002053&partnerID=MN8TOARS

U2 - 10.1524/zpch.1996.193.part_1_2.109

DO - 10.1524/zpch.1996.193.part_1_2.109

M3 - Article

JO - Zeitschrift für Physikalische Chemie

JF - Zeitschrift für Physikalische Chemie

SN - 0044-3336

ER -

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