Details
| Original language | English |
|---|---|
| Pages (from-to) | 1015-1020 |
| Number of pages | 6 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 2 |
| Publication status | Published - 2001 |
| Event | 2001 International Symposium on Electromagnetic Compatibility - Montrealm, Que., Canada Duration: 13 Aug 2001 → 17 Aug 2001 |
Abstract
The susceptibility of different types of single microcontrollers and complex microprocessorboards to unipolar fast rise time pulses were discussed. The susceptibility of the tested microcontrollers was found to be influenced by clock- and power supply line length. The susceptibility field strength levels of different microprocessor boards were also determined.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2001, p. 1015-1020.
Research output: Contribution to journal › Conference article › Research › peer review
}
TY - JOUR
T1 - UWB and EMP susceptibility of modern electronics
AU - Camp, Michael
AU - Garbe, Heyno
AU - Nitsch, Daniel
PY - 2001
Y1 - 2001
N2 - The susceptibility of different types of single microcontrollers and complex microprocessorboards to unipolar fast rise time pulses were discussed. The susceptibility of the tested microcontrollers was found to be influenced by clock- and power supply line length. The susceptibility field strength levels of different microprocessor boards were also determined.
AB - The susceptibility of different types of single microcontrollers and complex microprocessorboards to unipolar fast rise time pulses were discussed. The susceptibility of the tested microcontrollers was found to be influenced by clock- and power supply line length. The susceptibility field strength levels of different microprocessor boards were also determined.
UR - http://www.scopus.com/inward/record.url?scp=0035785613&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0035785613
VL - 2
SP - 1015
EP - 1020
JO - IEEE International Symposium on Electromagnetic Compatibility
JF - IEEE International Symposium on Electromagnetic Compatibility
SN - 0190-1494
T2 - 2001 International Symposium on Electromagnetic Compatibility
Y2 - 13 August 2001 through 17 August 2001
ER -