Details
| Original language | English |
|---|---|
| Pages (from-to) | 19-25 |
| Number of pages | 7 |
| Journal | Advances in Radio Science |
| Volume | 6 |
| Publication status | Published - 26 May 2008 |
Abstract
The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
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In: Advances in Radio Science, Vol. 6, 26.05.2008, p. 19-25.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Usage of the contactless vector network analysis with varying transmission line geometries
AU - Zelder, T.
AU - Geck, B.
AU - Rolfes, I.
AU - Eul, H.
PY - 2008/5/26
Y1 - 2008/5/26
N2 - The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.
AB - The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.
UR - http://www.scopus.com/inward/record.url?scp=67749137757&partnerID=8YFLogxK
U2 - 10.5194/ars-6-19-2008
DO - 10.5194/ars-6-19-2008
M3 - Article
AN - SCOPUS:67749137757
VL - 6
SP - 19
EP - 25
JO - Advances in Radio Science
JF - Advances in Radio Science
SN - 1684-9965
ER -