Details
| Original language | English |
|---|---|
| Article number | 081915 |
| Journal | Applied physics letters |
| Volume | 104 |
| Issue number | 8 |
| Publication status | Published - 24 Feb 2014 |
| Externally published | Yes |
Abstract
We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physics and Astronomy (miscellaneous)
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
In: Applied physics letters, Vol. 104, No. 8, 081915, 24.02.2014.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Uncertainty of the coefficient of band-to-band absorption of crystalline silicon at near-infrared wavelengths
AU - Schinke, Carsten
AU - Bothe, Karsten
AU - Schmidt, Jan
AU - Brendel, Rolf
PY - 2014/2/24
Y1 - 2014/2/24
N2 - We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.
AB - We present data of the coefficient of band-to-band absorption of crystalline silicon at 295 K in the wavelength range from 950 to 1350 nm and analyze its uncertainty. The data is obtained from measurements of reflectance and transmittance as well as spectrally resolved photoluminescence measurements and spectral response measurements. A rigorous measurement uncertainty analysis based on an extensive characterization of our setups is carried out. We determine relative uncertainties of 4% at 1000 nm, increasing to 22% at 1200 nm and 160% at 1300 nm, and show that all methods yield comparable results.
UR - http://www.scopus.com/inward/record.url?scp=84896803153&partnerID=8YFLogxK
U2 - 10.1063/1.4866916
DO - 10.1063/1.4866916
M3 - Article
AN - SCOPUS:84896803153
VL - 104
JO - Applied physics letters
JF - Applied physics letters
SN - 0003-6951
IS - 8
M1 - 081915
ER -