Details
| Original language | English |
|---|---|
| Title of host publication | Optical Micro- and Nanometrology VII |
| Editors | Anand Krishna Asundi, Wolfgang Osten, Christophe Gorecki |
| Publisher | SPIE |
| Number of pages | 10 |
| ISBN (electronic) | 9781510618824 |
| Publication status | Published - 24 May 2018 |
| Event | Optical Micro- and Nanometrology VII 2018 - Strasbourg, France Duration: 25 Apr 2018 → 26 Apr 2018 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 10678 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
This work proposes a two-step phase-shifting algorithm as an improvement of fringe projection profilometry. Considering the working process of fringe projection, the captured fringe image is formulated with two variables, i.e. surface reflectivity and phase value. And a phase shift of 3π/2 is introduced to get the two-step phase-shifting. After appropriate variable substitution, expressions of two fringe images can be transformed into two equations corresponding to a line and a circle respectively. With this circle-line model, the characteristic of solution and the phase error due to non-zero ambient light are analyzed. Then the approach of error compensation is proposed based on estimation of the real fringe contrast and non-linear least square optimization. The validity of the proposed approach is demonstrated with both simulations and experiments.
Keywords
- dynamic 3D shape measurement, fringe projection profilometry, phase-shifting profilometry, surface reflectivity, two-step phase-shifting
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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- Apa
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- BibTeX
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Optical Micro- and Nanometrology VII. ed. / Anand Krishna Asundi; Wolfgang Osten; Christophe Gorecki. SPIE, 2018. 106780V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10678).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Two-step phase shifting in fringe projection
T2 - Optical Micro- and Nanometrology VII 2018
AU - Mao, Jiaqi
AU - Yin, Yongkai
AU - Meng, Xiangfeng
AU - Yang, Xiulun
AU - Lu, Lei
AU - Li, Dechun
AU - Pape, Christian
AU - Reithmeier, Eduard
N1 - Funding information: The financial supports from the Natural Science Foundation of China (NSFC) under the grant 61775121, 61675117 and 61701321 and that from the Sino-German Center for Research Promotion (SGCRP) under the grant GZ 1391 are gratefully acknowledged. The support of Humboldt Research Fellowship for Postdoctoral Researchers is also acknowledged.
PY - 2018/5/24
Y1 - 2018/5/24
N2 - This work proposes a two-step phase-shifting algorithm as an improvement of fringe projection profilometry. Considering the working process of fringe projection, the captured fringe image is formulated with two variables, i.e. surface reflectivity and phase value. And a phase shift of 3π/2 is introduced to get the two-step phase-shifting. After appropriate variable substitution, expressions of two fringe images can be transformed into two equations corresponding to a line and a circle respectively. With this circle-line model, the characteristic of solution and the phase error due to non-zero ambient light are analyzed. Then the approach of error compensation is proposed based on estimation of the real fringe contrast and non-linear least square optimization. The validity of the proposed approach is demonstrated with both simulations and experiments.
AB - This work proposes a two-step phase-shifting algorithm as an improvement of fringe projection profilometry. Considering the working process of fringe projection, the captured fringe image is formulated with two variables, i.e. surface reflectivity and phase value. And a phase shift of 3π/2 is introduced to get the two-step phase-shifting. After appropriate variable substitution, expressions of two fringe images can be transformed into two equations corresponding to a line and a circle respectively. With this circle-line model, the characteristic of solution and the phase error due to non-zero ambient light are analyzed. Then the approach of error compensation is proposed based on estimation of the real fringe contrast and non-linear least square optimization. The validity of the proposed approach is demonstrated with both simulations and experiments.
KW - dynamic 3D shape measurement
KW - fringe projection profilometry
KW - phase-shifting profilometry
KW - surface reflectivity
KW - two-step phase-shifting
UR - http://www.scopus.com/inward/record.url?scp=85051207363&partnerID=8YFLogxK
U2 - 10.1117/12.2306641
DO - 10.1117/12.2306641
M3 - Conference contribution
AN - SCOPUS:85051207363
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Micro- and Nanometrology VII
A2 - Asundi, Anand Krishna
A2 - Osten, Wolfgang
A2 - Gorecki, Christophe
PB - SPIE
Y2 - 25 April 2018 through 26 April 2018
ER -