Transport characterization of in-plane gate devices fabricated by direct epitaxial growth on patterned substrates

Research output: Contribution to journalArticleResearchpeer review

Authors

  • M. Dilger
  • R. J. Haug
  • K. Eberl
  • A. Kurtenbach
  • Y. Kershaw
  • K. V. Klitzing

External Research Organisations

  • Max Planck Institute for Solid State Research (MPI-FKF)
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Details

Original languageEnglish
Pages (from-to)3132-3134
Number of pages3
JournalApplied physics letters
Volume68
Issue number22
Publication statusPublished - 1 Dec 1996
Externally publishedYes

Abstract

Direct molecular-beam epitaxial growth of GaAs/AlxGa1-xAs heterostructures on bow-tie shaped constrictions, prepatterned on GaAs substrates is used to fabricate in-plane gate transistors. The fabricated devices can be tuned by applying voltages to in-plane gates, which are also realized during the epitaxial growth. In this way, complete in-plane gate transistors are fabricated in a single growth process. Transport measurements of the devices at 1.3 K show conductance quantization or Coulomb blockade depending on the width of the constriction. The Coulomb blockade effect in the narrowest structures is caused by the formation of a self-assembled quantum dot in the center of the constriction.

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Cite this

Transport characterization of in-plane gate devices fabricated by direct epitaxial growth on patterned substrates. / Dilger, M.; Haug, R. J.; Eberl, K. et al.
In: Applied physics letters, Vol. 68, No. 22, 01.12.1996, p. 3132-3134.

Research output: Contribution to journalArticleResearchpeer review

Dilger M, Haug RJ, Eberl K, Kurtenbach A, Kershaw Y, Klitzing KV. Transport characterization of in-plane gate devices fabricated by direct epitaxial growth on patterned substrates. Applied physics letters. 1996 Dec 1;68(22):3132-3134. doi: 10.1063/1.115801
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