Details
| Original language | English |
|---|---|
| Article number | e202300699 |
| Journal | Chemistry - An Asian Journal |
| Volume | 18 |
| Issue number | 21 |
| Early online date | 15 Sept 2023 |
| Publication status | Published - 4 Nov 2023 |
Abstract
Crystalline Zr-fum-MOF (MOF-801) thin films of high quality are prepared on glass and silicon substrates by direct growth under solvothermal conditions. The synthesis is described in detail and the influence of different synthesis parameters such as temperature, precursor concentration, and the substrate type on the quality of the coatings is illustrated. Zr-fum-MOF thin films are characterized in terms of crystallinity, porosity, and homogeneity. Dense films of optical quality are obtained. The sorption behavior of the thin films is studied with various adsorptives. It can be easily monitored by measuring the transmission of the films in gas flows of different compositions. This simple transmission measurement at only one wavelength allows a very fast evaluation of the adsorption properties of thin films as compared to traditional sorption methods. The sorption behavior of the thin films is compared with the sorption properties of Zr-fum-MOF powder samples.
Keywords
- Metal-organic frameworks, MOF thin films, optical applications, porosimetry, Zr-fum-MOF
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)
- Biochemistry
- Chemistry(all)
- General Chemistry
- Chemistry(all)
- Organic Chemistry
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In: Chemistry - An Asian Journal, Vol. 18, No. 21, e202300699, 04.11.2023.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Transmission Porosimetry Study on High-quality Zr-fum-MOF Thin Films
AU - Keppler, Nils Christian
AU - Hannebauer, Adrian
AU - Hindricks, Karen Deli Josephine
AU - Zailskas, Saskia
AU - Schaate, Andreas
AU - Behrens, Peter
N1 - Funding Information: N. C. K. and A. H. contributed equally to this work. This work was funded by the Deutsche Forschungsgemeinschaft (DFG) under Germany's Excellence Strategy within the Cluster of Excellence PhoenixD (EXC 2122, Project ID 390833453). Adrian Hannebauer thanks the hsn (Hannover School for Nanotechnology) for a scholarship. Karen Hindricks thanks the Studienstiftung des Deutschen Volkes (German National Academic Foundation) for a scholarship. We want to thank Younes Senft for building the UV/vis measurement cell. Additionally, we would like to thank Marvin Treger for help with the Tauc plot. Open Access funding enabled and organized by Projekt DEAL.
PY - 2023/11/4
Y1 - 2023/11/4
N2 - Crystalline Zr-fum-MOF (MOF-801) thin films of high quality are prepared on glass and silicon substrates by direct growth under solvothermal conditions. The synthesis is described in detail and the influence of different synthesis parameters such as temperature, precursor concentration, and the substrate type on the quality of the coatings is illustrated. Zr-fum-MOF thin films are characterized in terms of crystallinity, porosity, and homogeneity. Dense films of optical quality are obtained. The sorption behavior of the thin films is studied with various adsorptives. It can be easily monitored by measuring the transmission of the films in gas flows of different compositions. This simple transmission measurement at only one wavelength allows a very fast evaluation of the adsorption properties of thin films as compared to traditional sorption methods. The sorption behavior of the thin films is compared with the sorption properties of Zr-fum-MOF powder samples.
AB - Crystalline Zr-fum-MOF (MOF-801) thin films of high quality are prepared on glass and silicon substrates by direct growth under solvothermal conditions. The synthesis is described in detail and the influence of different synthesis parameters such as temperature, precursor concentration, and the substrate type on the quality of the coatings is illustrated. Zr-fum-MOF thin films are characterized in terms of crystallinity, porosity, and homogeneity. Dense films of optical quality are obtained. The sorption behavior of the thin films is studied with various adsorptives. It can be easily monitored by measuring the transmission of the films in gas flows of different compositions. This simple transmission measurement at only one wavelength allows a very fast evaluation of the adsorption properties of thin films as compared to traditional sorption methods. The sorption behavior of the thin films is compared with the sorption properties of Zr-fum-MOF powder samples.
KW - Metal-organic frameworks
KW - MOF thin films
KW - optical applications
KW - porosimetry
KW - Zr-fum-MOF
UR - http://www.scopus.com/inward/record.url?scp=85172087305&partnerID=8YFLogxK
U2 - 10.1002/asia.202300699
DO - 10.1002/asia.202300699
M3 - Article
AN - SCOPUS:85172087305
VL - 18
JO - Chemistry - An Asian Journal
JF - Chemistry - An Asian Journal
SN - 1861-4728
IS - 21
M1 - e202300699
ER -