Details
| Original language | English |
|---|---|
| Pages (from-to) | 233-242 |
| Number of pages | 10 |
| Journal | European journal of mineralogy |
| Volume | 17 |
| Issue number | 2 |
| Publication status | Published - 29 Apr 2005 |
Abstract
Two microbeam techniques, synchrotron radiation X-ray fluorescence micro-analysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS) are compared for analyzing diffusion profiles of trace elements in two hydrous rhyolitic glasses (1.87 and 5.00wt% H2O). In order to verify the results, laser ablation coupled to inductively coupled plasma optical emission (LA-ICP-OES) has been used on one sample. Samples were produced by diffusion couple experiments performed in an internally heated gas pressure vessel at 1200°C and 500 MPa. One half of each couple was doped with 24 trace elements representing different geochemical groups: low field strength elements (Rb, Sr, Ba), transition metals (Cr, Co, Ni, Cu, Zn), rare earth elements (La, Ce, Nd, Sm, Eu, Gd, Er, Yb) + Y, high field strength elements (V, Zr, Nb, Hf, Ta) and main group elements (Ge, Sn). Several profiles were measured with both p-SRXRF and SIMS on both samples. In principle, concentrations of all elements can be extracted simultaneously from a single SRXRF spectrum. However, some trace elements could not be reliably quantified with our analytical system: Ta and Pb (used for detector collimator material), Ti, V (low energy of Kα, Co (Kα-peak overlapping with Fe K β-peak) and Cr, Ni, Cu, Zn (overlapping with 1-lines of REEs). In contrast, SIMS analyses measure each element sequentially. Hence, not all elements of the large total set of trace elements could be analyzed in a single run. Some elements requiring a high mass resolution (NaSi interfering with V, CaO interfering with Ni) or having low yields (Sn) were not profiled. Multi ple diffusivities derived from V-SRXRF and SIMS profiles are in very good agreement for most elements. In general, the trace element diffusivity decreases with increasing valence state, e.g. in sample D22 containing 1.87 wt% H 2O from log D = -10.80 for the monovalent Rb to log D=-13.34 for the tetravalent Zr (Din m2/s). By increasing the water content in sample D18 to 5.00 wt%, diffusion coefficients increase approximately by one order of magnitude for all elements studied.
Keywords
- Rhyolite, SIMS, Synchroton radiation X-ray fluorescence microanalysis, Trace element diffusion
ASJC Scopus subject areas
- Earth and Planetary Sciences(all)
- Geochemistry and Petrology
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In: European journal of mineralogy, Vol. 17, No. 2, 29.04.2005, p. 233-242.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Trace element diffusion in rhyolitic melts
T2 - Comparison between synchrotron radiation X-ray fluorescene microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS)
AU - Hahn, Matthias
AU - Behrens, Harald
AU - Tegge-Schüring, Astrid
AU - Koepke, Jürgen
AU - Horn, Ingo
AU - Rickers, Karen
AU - Falkenberg, Gerald
AU - Wiedenbeck, Michael
PY - 2005/4/29
Y1 - 2005/4/29
N2 - Two microbeam techniques, synchrotron radiation X-ray fluorescence micro-analysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS) are compared for analyzing diffusion profiles of trace elements in two hydrous rhyolitic glasses (1.87 and 5.00wt% H2O). In order to verify the results, laser ablation coupled to inductively coupled plasma optical emission (LA-ICP-OES) has been used on one sample. Samples were produced by diffusion couple experiments performed in an internally heated gas pressure vessel at 1200°C and 500 MPa. One half of each couple was doped with 24 trace elements representing different geochemical groups: low field strength elements (Rb, Sr, Ba), transition metals (Cr, Co, Ni, Cu, Zn), rare earth elements (La, Ce, Nd, Sm, Eu, Gd, Er, Yb) + Y, high field strength elements (V, Zr, Nb, Hf, Ta) and main group elements (Ge, Sn). Several profiles were measured with both p-SRXRF and SIMS on both samples. In principle, concentrations of all elements can be extracted simultaneously from a single SRXRF spectrum. However, some trace elements could not be reliably quantified with our analytical system: Ta and Pb (used for detector collimator material), Ti, V (low energy of Kα, Co (Kα-peak overlapping with Fe K β-peak) and Cr, Ni, Cu, Zn (overlapping with 1-lines of REEs). In contrast, SIMS analyses measure each element sequentially. Hence, not all elements of the large total set of trace elements could be analyzed in a single run. Some elements requiring a high mass resolution (NaSi interfering with V, CaO interfering with Ni) or having low yields (Sn) were not profiled. Multi ple diffusivities derived from V-SRXRF and SIMS profiles are in very good agreement for most elements. In general, the trace element diffusivity decreases with increasing valence state, e.g. in sample D22 containing 1.87 wt% H 2O from log D = -10.80 for the monovalent Rb to log D=-13.34 for the tetravalent Zr (Din m2/s). By increasing the water content in sample D18 to 5.00 wt%, diffusion coefficients increase approximately by one order of magnitude for all elements studied.
AB - Two microbeam techniques, synchrotron radiation X-ray fluorescence micro-analysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS) are compared for analyzing diffusion profiles of trace elements in two hydrous rhyolitic glasses (1.87 and 5.00wt% H2O). In order to verify the results, laser ablation coupled to inductively coupled plasma optical emission (LA-ICP-OES) has been used on one sample. Samples were produced by diffusion couple experiments performed in an internally heated gas pressure vessel at 1200°C and 500 MPa. One half of each couple was doped with 24 trace elements representing different geochemical groups: low field strength elements (Rb, Sr, Ba), transition metals (Cr, Co, Ni, Cu, Zn), rare earth elements (La, Ce, Nd, Sm, Eu, Gd, Er, Yb) + Y, high field strength elements (V, Zr, Nb, Hf, Ta) and main group elements (Ge, Sn). Several profiles were measured with both p-SRXRF and SIMS on both samples. In principle, concentrations of all elements can be extracted simultaneously from a single SRXRF spectrum. However, some trace elements could not be reliably quantified with our analytical system: Ta and Pb (used for detector collimator material), Ti, V (low energy of Kα, Co (Kα-peak overlapping with Fe K β-peak) and Cr, Ni, Cu, Zn (overlapping with 1-lines of REEs). In contrast, SIMS analyses measure each element sequentially. Hence, not all elements of the large total set of trace elements could be analyzed in a single run. Some elements requiring a high mass resolution (NaSi interfering with V, CaO interfering with Ni) or having low yields (Sn) were not profiled. Multi ple diffusivities derived from V-SRXRF and SIMS profiles are in very good agreement for most elements. In general, the trace element diffusivity decreases with increasing valence state, e.g. in sample D22 containing 1.87 wt% H 2O from log D = -10.80 for the monovalent Rb to log D=-13.34 for the tetravalent Zr (Din m2/s). By increasing the water content in sample D18 to 5.00 wt%, diffusion coefficients increase approximately by one order of magnitude for all elements studied.
KW - Rhyolite
KW - SIMS
KW - Synchroton radiation X-ray fluorescence microanalysis
KW - Trace element diffusion
UR - http://www.scopus.com/inward/record.url?scp=18444381750&partnerID=8YFLogxK
U2 - 10.1127/0935-1221/2005/0017-0233
DO - 10.1127/0935-1221/2005/0017-0233
M3 - Article
AN - SCOPUS:18444381750
VL - 17
SP - 233
EP - 242
JO - European journal of mineralogy
JF - European journal of mineralogy
SN - 0935-1221
IS - 2
ER -