Tool-supported design space exploration of a processor system for SIFT-feature detection

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Original languageEnglish
Title of host publication2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin)
PublisherIEEE Computer Society
Pages168-169
Number of pages2
ISBN (electronic)9781509040148
ISBN (print)978-1-5090-4015-5
Publication statusPublished - 18 Dec 2017
Event7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017 - Berlin, Germany
Duration: 3 Sept 20176 Sept 2017

ASJC Scopus subject areas

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Tool-supported design space exploration of a processor system for SIFT-feature detection. / Hartig, Julian; Paya-Vaya, Guillermo; Heymann, Henrik et al.
2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, 2017. p. 168-169.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Hartig, J, Paya-Vaya, G, Heymann, H & Blume, H 2017, Tool-supported design space exploration of a processor system for SIFT-feature detection. in 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, pp. 168-169, 7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017, Berlin, Germany, 3 Sept 2017. https://doi.org/10.1109/ICCE-Berlin.2017.8210619
Hartig, J., Paya-Vaya, G., Heymann, H., & Blume, H. (2017). Tool-supported design space exploration of a processor system for SIFT-feature detection. In 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin) (pp. 168-169). IEEE Computer Society. https://doi.org/10.1109/ICCE-Berlin.2017.8210619
Hartig J, Paya-Vaya G, Heymann H, Blume H. Tool-supported design space exploration of a processor system for SIFT-feature detection. In 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society. 2017. p. 168-169 doi: 10.1109/ICCE-Berlin.2017.8210619
Hartig, Julian ; Paya-Vaya, Guillermo ; Heymann, Henrik et al. / Tool-supported design space exploration of a processor system for SIFT-feature detection. 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin). IEEE Computer Society, 2017. pp. 168-169
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@inproceedings{70805606cf2f432fb8b796a2b8868d68,
title = "Tool-supported design space exploration of a processor system for SIFT-feature detection",
author = "Julian Hartig and Guillermo Paya-Vaya and Henrik Heymann and Holger Blume",
year = "2017",
month = dec,
day = "18",
doi = "10.1109/ICCE-Berlin.2017.8210619",
language = "English",
isbn = "978-1-5090-4015-5",
pages = "168--169",
booktitle = "2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin)",
publisher = "IEEE Computer Society",
address = "United States",
note = "7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017 ; Conference date: 03-09-2017 Through 06-09-2017",

}

Download

TY - GEN

T1 - Tool-supported design space exploration of a processor system for SIFT-feature detection

AU - Hartig, Julian

AU - Paya-Vaya, Guillermo

AU - Heymann, Henrik

AU - Blume, Holger

PY - 2017/12/18

Y1 - 2017/12/18

U2 - 10.1109/ICCE-Berlin.2017.8210619

DO - 10.1109/ICCE-Berlin.2017.8210619

M3 - Conference contribution

AN - SCOPUS:85043986989

SN - 978-1-5090-4015-5

SP - 168

EP - 169

BT - 2017 IEEE 7th International Conference on Consumer Electronics - Berlin (ICCE-Berlin)

PB - IEEE Computer Society

T2 - 7th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2017

Y2 - 3 September 2017 through 6 September 2017

ER -

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