Details
| Original language | English |
|---|---|
| Pages (from-to) | 2292-2295 |
| Number of pages | 4 |
| Journal | Physical review letters |
| Volume | 71 |
| Issue number | 14 |
| Publication status | Published - 1 Jan 1993 |
| Externally published | Yes |
Abstract
In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- General Physics and Astronomy
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In: Physical review letters, Vol. 71, No. 14, 01.01.1993, p. 2292-2295.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Time-resolved measurements of transport in edge channels
AU - Zhitenev, N. B.
AU - Haug, R. J.
AU - Klitzing, K. V.
AU - Eberl, K.
PY - 1993/1/1
Y1 - 1993/1/1
N2 - In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
AB - In the quantum Hall regime the influence of edge channels on the evolution of the current through the device has been analyzed by time-resolved transport measurements. The observed nonlinear dependence of the time-resolved current on applied voltage is qualitatively in agreement with the model describing edge channels as compressible strips separated by incompressible regions.
UR - http://www.scopus.com/inward/record.url?scp=0001673926&partnerID=8YFLogxK
U2 - 10.1103/PhysRevLett.71.2292
DO - 10.1103/PhysRevLett.71.2292
M3 - Article
AN - SCOPUS:0001673926
VL - 71
SP - 2292
EP - 2295
JO - Physical review letters
JF - Physical review letters
SN - 0031-9007
IS - 14
ER -