Details
| Original language | English |
|---|---|
| Title of host publication | 2023 13th European Space Power Conference, ESPC 2023 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (electronic) | 9798350328998 |
| ISBN (print) | 979-8-3503-2900-1 |
| Publication status | Published - 2023 |
| Event | 13th European Space Power Conference, ESPC 2023 - Elche, Spain Duration: 2 Oct 2023 → 6 Oct 2023 |
Abstract
In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.
Keywords
- Protection IC, Radiation, SEE, Single Event Effect, Space, TID, Total Ionizing Dose, Voltage Clamp
ASJC Scopus subject areas
- Energy(all)
- Energy Engineering and Power Technology
- Engineering(all)
- Electrical and Electronic Engineering
- Engineering(all)
- Aerospace Engineering
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2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc., 2023.
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications
AU - Mand, Philipp
AU - Burkhay, Volodymyr
AU - Rocke, Andre
AU - Gieselmann, Uwe
AU - Fauth, Leon
AU - Olbrich, Markus
AU - Beister, Jurgen
AU - Landstrom, Sven
AU - Tonicello, Ferdinando
AU - Wicht, Bernhard
AU - Friebe, Jens
N1 - Publisher Copyright: © 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.
AB - In power conversion and distribution systems, overvoltage conditions can cause damage or destruction of the load. Redundancy does not necessarily solve this problem. A radiation-resistant voltage clamp can limit the output voltage to the set maximum value and thus protect the load. This paper presents the radiation performance of a newly developed prototype latch-up immune voltage clamp that can clamp voltages up to 40 V. The partially ESA-certified ATMEL ATMX150RHA silicon-on-insulator technology was used to make the IC immune to latch-ups. In addition, 'hardness-by-design' techniques were used. To ensure reliability in the space environment, the ICs were tested for radiation tolerance. The results of total ionizing dose effects and destructive single-event effects are presented in this paper. The evaluation of the DSEE-related safe operating area in space is also given. The analysis and possible improvements in the design of this prototype IC are given. Since not all transistors in the ATMX150RHA technology have been previously tested against TID effects, the test results also provide additional information on the radiation behavior of the technology.
KW - Protection IC
KW - Radiation
KW - SEE
KW - Single Event Effect
KW - Space
KW - TID
KW - Total Ionizing Dose
KW - Voltage Clamp
UR - http://www.scopus.com/inward/record.url?scp=85185002610&partnerID=8YFLogxK
U2 - 10.1109/espc59009.2023.10413255
DO - 10.1109/espc59009.2023.10413255
M3 - Conference contribution
AN - SCOPUS:85185002610
SN - 979-8-3503-2900-1
BT - 2023 13th European Space Power Conference, ESPC 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th European Space Power Conference, ESPC 2023
Y2 - 2 October 2023 through 6 October 2023
ER -