Details
| Original language | English |
|---|---|
| Pages (from-to) | 83-90 |
| Number of pages | 8 |
| Journal | Advanced Materials Research |
| Volume | 22 |
| Early online date | 15 Aug 2007 |
| Publication status | Published - 2007 |
Abstract
This paper deals with the measurement and the detection of errors in the three-dimensional geometry of high-strength structure components. Firstly different geometrical measuring systems and their usability for the measurement of high-strength structure components are discussed. An optimized solution is suggested, an adaptive projection method based on pattern projection is introduced. The technique takes care of the special properties of high-strength structure components within the production process. The measurement procedure is divided into two steps. Within the adaptation-step the luminescence and the resolution of the projected pattern is adapted on the measured object. The actual picture is taken and calculated in a second step in order to avoid vibrations. The paper concludes with a description of the data processing procedures necessary in order to evaluate the correctness of the measured structure and describes how a 100% geometrical quality control can be achieved using the described methods.
Keywords
- Fringe projection, Inline inspection, Matching, Optical inspection, Stripe pattern
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
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In: Advanced Materials Research, Vol. 22, 2007, p. 83-90.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Three-Dimensional Optical Measurement with Locally Adapted Projection
AU - Denkena, B.
AU - Acker, W.
PY - 2007
Y1 - 2007
N2 - This paper deals with the measurement and the detection of errors in the three-dimensional geometry of high-strength structure components. Firstly different geometrical measuring systems and their usability for the measurement of high-strength structure components are discussed. An optimized solution is suggested, an adaptive projection method based on pattern projection is introduced. The technique takes care of the special properties of high-strength structure components within the production process. The measurement procedure is divided into two steps. Within the adaptation-step the luminescence and the resolution of the projected pattern is adapted on the measured object. The actual picture is taken and calculated in a second step in order to avoid vibrations. The paper concludes with a description of the data processing procedures necessary in order to evaluate the correctness of the measured structure and describes how a 100% geometrical quality control can be achieved using the described methods.
AB - This paper deals with the measurement and the detection of errors in the three-dimensional geometry of high-strength structure components. Firstly different geometrical measuring systems and their usability for the measurement of high-strength structure components are discussed. An optimized solution is suggested, an adaptive projection method based on pattern projection is introduced. The technique takes care of the special properties of high-strength structure components within the production process. The measurement procedure is divided into two steps. Within the adaptation-step the luminescence and the resolution of the projected pattern is adapted on the measured object. The actual picture is taken and calculated in a second step in order to avoid vibrations. The paper concludes with a description of the data processing procedures necessary in order to evaluate the correctness of the measured structure and describes how a 100% geometrical quality control can be achieved using the described methods.
KW - Fringe projection
KW - Inline inspection
KW - Matching
KW - Optical inspection
KW - Stripe pattern
UR - http://www.scopus.com/inward/record.url?scp=36249000840&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMR.22.83
DO - 10.4028/www.scientific.net/AMR.22.83
M3 - Article
AN - SCOPUS:36249000840
VL - 22
SP - 83
EP - 90
JO - Advanced Materials Research
JF - Advanced Materials Research
SN - 1022-6680
ER -