Details
| Original language | English |
|---|---|
| Title of host publication | Laser-induced damage in optical materials |
| Subtitle of host publication | 1999 : 4 - 7 October 1999, Boulder, Colorado ; proceedings |
| Place of Publication | Bellingham |
| Publisher | SPIE |
| Pages | 242-249 |
| Number of pages | 8 |
| ISBN (print) | 0-8194-3508-2 |
| Publication status | Published - 3 Mar 2000 |
| Externally published | Yes |
| Event | 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA Duration: 4 Oct 1999 → 7 Oct 1999 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Publisher | SPIE |
| Volume | 3902 |
| ISSN (Print) | 0277-786X |
Abstract
HR layer stacks with increasing number of HL pairs of fluoride materials deposited on different substrates have been successfully investigated with respect to the laser radiation damage threshold at 248 nm and 193 nm. In this paper the investigation has been extended on resonant as well as non-resonant oxide coatings deposited by ion beam sputtering (IBS). Compared to conventional evaporation and plasma ion assisted evaporation technique, IBS coatings exhibit a higher packing density, thus preventing water to enter the film which would degrade the quality of the coatings. In contrast, the thermal stress is increased in IBS layer stacks. The measurements were carried out by use of the pulsed thermal lens technique enabling us to measure the advent of optical breakdown induced by laser fluences in the subdamage range.
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
Laser-induced damage in optical materials: 1999 : 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. p. 242-249 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Thickness dependence of damage thresholds for 193 nm dielectric mirrors by predamage sensitive photothermal technique
AU - Blaschke, Holger
AU - Arens, Winfried
AU - Ristau, Detlev
AU - Martin, Sven
AU - Li, Bincheng
AU - Welsch, Eberhard
PY - 2000/3/3
Y1 - 2000/3/3
N2 - HR layer stacks with increasing number of HL pairs of fluoride materials deposited on different substrates have been successfully investigated with respect to the laser radiation damage threshold at 248 nm and 193 nm. In this paper the investigation has been extended on resonant as well as non-resonant oxide coatings deposited by ion beam sputtering (IBS). Compared to conventional evaporation and plasma ion assisted evaporation technique, IBS coatings exhibit a higher packing density, thus preventing water to enter the film which would degrade the quality of the coatings. In contrast, the thermal stress is increased in IBS layer stacks. The measurements were carried out by use of the pulsed thermal lens technique enabling us to measure the advent of optical breakdown induced by laser fluences in the subdamage range.
AB - HR layer stacks with increasing number of HL pairs of fluoride materials deposited on different substrates have been successfully investigated with respect to the laser radiation damage threshold at 248 nm and 193 nm. In this paper the investigation has been extended on resonant as well as non-resonant oxide coatings deposited by ion beam sputtering (IBS). Compared to conventional evaporation and plasma ion assisted evaporation technique, IBS coatings exhibit a higher packing density, thus preventing water to enter the film which would degrade the quality of the coatings. In contrast, the thermal stress is increased in IBS layer stacks. The measurements were carried out by use of the pulsed thermal lens technique enabling us to measure the advent of optical breakdown induced by laser fluences in the subdamage range.
UR - http://www.scopus.com/inward/record.url?scp=0033878130&partnerID=8YFLogxK
U2 - 10.1117/12.379306
DO - 10.1117/12.379306
M3 - Conference contribution
AN - SCOPUS:0033878130
SN - 0-8194-3508-2
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 242
EP - 249
BT - Laser-induced damage in optical materials
PB - SPIE
CY - Bellingham
T2 - 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999'
Y2 - 4 October 1999 through 7 October 1999
ER -