The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes

Research output: Contribution to conference › Paper › Research › peer review

Authors

Manfred Beyer
C. D. Ritschel

Research Organisations

High Voltage Engineering and Asset Management Section (Schering Institute)

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Details

Original language	English
Publication status	Published - 1985

Cite this

The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes. / Beyer , Manfred ; Ritschel, C. D.
1985.

Research output: Contribution to conference › Paper › Research › peer review

Beyer , M & Ritschel, CD 1985, 'The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes'.

Beyer , M., & Ritschel, C. D. (1985). The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes.

Beyer M, Ritschel CD. The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes. 1985.

Beyer , Manfred ; Ritschel, C. D. / The influence of Humidity on the Breakdown of SF6 with Dielectric-Coated Electrodes.

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