The growth of nanometer Si/SiGe/Si quantum well wires with local molecular beam epitaxy in dependence on the shadow mask geometry

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Myeongcheol Kim
  • H. J. Osten
  • A. Wolff
  • C. Quick
  • H. P. Zeindl
  • J. Klatt
  • D. Knoll

External Research Organisations

  • Leibniz Institute for High Performance Microelectronics (IHP)
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Details

Original languageEnglish
Pages (from-to)508-515
Number of pages8
JournalJournal of crystal growth
Volume167
Issue number3-4
Publication statusPublished - Oct 1996
Externally publishedYes

Abstract

We report on molecular beam epitaxial growth of nanometer structures using shadow masks deposited directly onto the substrate. A preparation method for these masks with dimensions of only few 10 nm based on optical lithography is shown using a spacer technology. Si/Si0.8Ge0.2/Si quantum well wires (QWRs) smaller than 100 nm were grown. The obtained wire shapes are investigated by scanning and transmission electron microscopy as a function of shadow mask design and evaporation source geometry. Both the mask geometry and the surface diffusion of adatoms have to be considered for predicting wire shapes. From an analysis of different grown wires it becomes evident that the geometries of the mask and deposition system play the most important role in deciding the shape of QWRs. At high growth temperatures an enhanced surface diffusion causes a modulation of the Ge content and lowers the thickness of the SiGe quantum well. For the growth at lower temperatures, the relation between mask geometry and wire shape can be treated with purely geometrical arguments.

ASJC Scopus subject areas

Cite this

The growth of nanometer Si/SiGe/Si quantum well wires with local molecular beam epitaxy in dependence on the shadow mask geometry. / Kim, Myeongcheol; Osten, H. J.; Wolff, A. et al.
In: Journal of crystal growth, Vol. 167, No. 3-4, 10.1996, p. 508-515.

Research output: Contribution to journalArticleResearchpeer review

Kim M, Osten HJ, Wolff A, Quick C, Zeindl HP, Klatt J et al. The growth of nanometer Si/SiGe/Si quantum well wires with local molecular beam epitaxy in dependence on the shadow mask geometry. Journal of crystal growth. 1996 Oct;167(3-4):508-515. doi: 10.1016/0022-0248(96)00255-2
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abstract = "We report on molecular beam epitaxial growth of nanometer structures using shadow masks deposited directly onto the substrate. A preparation method for these masks with dimensions of only few 10 nm based on optical lithography is shown using a spacer technology. Si/Si0.8Ge0.2/Si quantum well wires (QWRs) smaller than 100 nm were grown. The obtained wire shapes are investigated by scanning and transmission electron microscopy as a function of shadow mask design and evaporation source geometry. Both the mask geometry and the surface diffusion of adatoms have to be considered for predicting wire shapes. From an analysis of different grown wires it becomes evident that the geometries of the mask and deposition system play the most important role in deciding the shape of QWRs. At high growth temperatures an enhanced surface diffusion causes a modulation of the Ge content and lowers the thickness of the SiGe quantum well. For the growth at lower temperatures, the relation between mask geometry and wire shape can be treated with purely geometrical arguments.",
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Download

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AU - Kim, Myeongcheol

AU - Osten, H. J.

AU - Wolff, A.

AU - Quick, C.

AU - Zeindl, H. P.

AU - Klatt, J.

AU - Knoll, D.

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