Details
| Original language | English |
|---|---|
| Article number | 305202 |
| Journal | Nanotechnology |
| Volume | 23 |
| Issue number | 30 |
| Publication status | Published - 2 Jul 2012 |
Abstract
In the context of investigations of physical, chemical and electrical properties of ultra-thin layers of epitaxial and monocrystalline Sr 0.3Ba 0.7Oon Si(100), we also investigated their thermal stability with x-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). At temperatures above 400°C, transformation into silicate layers sets in. The stoichiometry after complete transformation was determined to be close to (Ba 0.8Sr 0.2) 2SiO 4 except for layers of only a few monolayers, where the silicate is not stoichiometric. There are strong indications that this silicate is stable until it desorbs at temperatures above 750°C. Crystallinity, as seen with LEED, is lost during this transformation. Although transformation into silicate is coupled with metal desorption and compactification of the layers, they seem to remain closed. In addition, traces of Ba silicide at the Si interface were detected after layer desorption. This silicide cannot be desorbed thermally. The silicate layer has a bandgap of 5.9±0.2eV already for 3ML thickness. Upon exposure to air, carbon and oxygen containing species, but no hydroxide, are formed irreversibly.
ASJC Scopus subject areas
- Chemical Engineering(all)
- Bioengineering
- Chemistry(all)
- General Chemistry
- Materials Science(all)
- General Materials Science
- Engineering(all)
- Mechanics of Materials
- Engineering(all)
- Mechanical Engineering
- Engineering(all)
- Electrical and Electronic Engineering
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In: Nanotechnology, Vol. 23, No. 30, 305202, 02.07.2012.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Temperature stability of ultra-thin mixed BaSr-oxide layers and their transformation
AU - Müller-Sajak, D.
AU - Islam, Saiful
AU - Pfnür, Herbert
AU - Hofmann, Karl Rüdiger
PY - 2012/7/2
Y1 - 2012/7/2
N2 - In the context of investigations of physical, chemical and electrical properties of ultra-thin layers of epitaxial and monocrystalline Sr 0.3Ba 0.7Oon Si(100), we also investigated their thermal stability with x-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). At temperatures above 400°C, transformation into silicate layers sets in. The stoichiometry after complete transformation was determined to be close to (Ba 0.8Sr 0.2) 2SiO 4 except for layers of only a few monolayers, where the silicate is not stoichiometric. There are strong indications that this silicate is stable until it desorbs at temperatures above 750°C. Crystallinity, as seen with LEED, is lost during this transformation. Although transformation into silicate is coupled with metal desorption and compactification of the layers, they seem to remain closed. In addition, traces of Ba silicide at the Si interface were detected after layer desorption. This silicide cannot be desorbed thermally. The silicate layer has a bandgap of 5.9±0.2eV already for 3ML thickness. Upon exposure to air, carbon and oxygen containing species, but no hydroxide, are formed irreversibly.
AB - In the context of investigations of physical, chemical and electrical properties of ultra-thin layers of epitaxial and monocrystalline Sr 0.3Ba 0.7Oon Si(100), we also investigated their thermal stability with x-ray photoelectron spectroscopy (XPS), electron energy loss spectroscopy (EELS), and low energy electron diffraction (LEED). At temperatures above 400°C, transformation into silicate layers sets in. The stoichiometry after complete transformation was determined to be close to (Ba 0.8Sr 0.2) 2SiO 4 except for layers of only a few monolayers, where the silicate is not stoichiometric. There are strong indications that this silicate is stable until it desorbs at temperatures above 750°C. Crystallinity, as seen with LEED, is lost during this transformation. Although transformation into silicate is coupled with metal desorption and compactification of the layers, they seem to remain closed. In addition, traces of Ba silicide at the Si interface were detected after layer desorption. This silicide cannot be desorbed thermally. The silicate layer has a bandgap of 5.9±0.2eV already for 3ML thickness. Upon exposure to air, carbon and oxygen containing species, but no hydroxide, are formed irreversibly.
UR - http://www.scopus.com/inward/record.url?scp=84863700601&partnerID=8YFLogxK
U2 - 10.1088/0957-4484/23/30/305202
DO - 10.1088/0957-4484/23/30/305202
M3 - Article
AN - SCOPUS:84863700601
VL - 23
JO - Nanotechnology
JF - Nanotechnology
SN - 0957-4484
IS - 30
M1 - 305202
ER -