Details
Original language | English |
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Title of host publication | Time and Frequency Metrology II |
Publisher | SPIE |
ISBN (print) | 9780819477217 |
Publication status | Published - 25 Aug 2009 |
Event | SPIE OPTICAL ENGINEERING + APPLICATIONS - San Diego, CA, United States Duration: 2 Aug 2009 → 6 Aug 2009 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 7431 |
ISSN (Print) | 0277-786X |
Keywords
- Frequency comb, Optical frequency standard, Optical frequency transfer, Remote optical frequency measurement, Stabilized fiber link
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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Time and Frequency Metrology II. SPIE, 2009. 74310B (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7431).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Telecommunication fiber link for the remote characterization of a magnesium optical frequency standard
AU - Terra, Osama
AU - Grosche, Gesine
AU - Ertmer, Wolfgang
AU - Feldmann, Thorsten
AU - Friebe, Jan
AU - Legero, Thomas
AU - Lipphardt, Burghard
AU - Pape, Andre
AU - Predehl, Katharina
AU - Rasel, Ernst
AU - Riedmann, Matthias
AU - Sterr, Uwe
AU - Wübbena, Temmo
AU - Schnatz, Harald
PY - 2009/8/25
Y1 - 2009/8/25
KW - Frequency comb
KW - Optical frequency standard
KW - Optical frequency transfer
KW - Remote optical frequency measurement
KW - Stabilized fiber link
UR - http://www.scopus.com/inward/record.url?scp=71049174175&partnerID=8YFLogxK
U2 - 10.1117/12.825228
DO - 10.1117/12.825228
M3 - Conference contribution
AN - SCOPUS:71049174175
SN - 9780819477217
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Time and Frequency Metrology II
PB - SPIE
T2 - SPIE OPTICAL ENGINEERING + APPLICATIONS
Y2 - 2 August 2009 through 6 August 2009
ER -