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Switchable nanometer contacts: Ultrathin Ag nanostructures on Si(100)

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Authors

  • Gernot Gardinowski
  • Jedrzej Schmeidel
  • Herbert Pfnür
  • Thomas Block
  • Christoph Tegenkamp

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Original languageEnglish
Article number063120
JournalApplied Physics Letters
Volume89
Issue number6
Publication statusPublished - 10 Aug 2006

Abstract

The fabrication and characterization of metallic nanometer-sized gaps suitable for conductivity measurements of single molecules were studied. Controlled gap formation by electromigration (EM) is demonstrated in contiguous and ultrathin Ag structures wetting the Si(100) substrate. The gaps obtained are in the range of nanometers or even subnanometers, as revealed by lateral conductivity measurements and scanning tunneling microscopy carried out under ultrahigh vacuum conditions. Annealing to 300 K closes the gap by enabling surface diffusion of Ag, and another cycle of opening by EM at 80 K can be performed. The functionality of the contacts is demonstrated by insertion of ferrocenedithiol molecules into the gap.

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Switchable nanometer contacts: Ultrathin Ag nanostructures on Si(100). / Gardinowski, Gernot; Schmeidel, Jedrzej; Pfnür, Herbert et al.
In: Applied Physics Letters, Vol. 89, No. 6, 063120, 10.08.2006.

Research output: Contribution to journalArticleResearchpeer review

Gardinowski, G., Schmeidel, J., Pfnür, H., Block, T., & Tegenkamp, C. (2006). Switchable nanometer contacts: Ultrathin Ag nanostructures on Si(100). Applied Physics Letters, 89(6), Article 063120. https://doi.org/10.1063/1.2336650
Gardinowski G, Schmeidel J, Pfnür H, Block T, Tegenkamp C. Switchable nanometer contacts: Ultrathin Ag nanostructures on Si(100). Applied Physics Letters. 2006 Aug 10;89(6):063120. doi: 10.1063/1.2336650
Gardinowski, Gernot ; Schmeidel, Jedrzej ; Pfnür, Herbert et al. / Switchable nanometer contacts : Ultrathin Ag nanostructures on Si(100). In: Applied Physics Letters. 2006 ; Vol. 89, No. 6.
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AU - Gardinowski, Gernot

AU - Schmeidel, Jedrzej

AU - Pfnür, Herbert

AU - Block, Thomas

AU - Tegenkamp, Christoph

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