Details
| Original language | English |
|---|---|
| Pages (from-to) | 380-389 |
| Number of pages | 10 |
| Journal | IEEE Transactions on Electromagnetic Compatibility |
| Volume | 46 |
| Issue number | 3 |
| Publication status | Published - 24 Aug 2004 |
Abstract
In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Atomic and Molecular Physics, and Optics
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
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In: IEEE Transactions on Electromagnetic Compatibility, Vol. 46, No. 3, 24.08.2004, p. 380-389.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Susceptibility of Some Electronic Equipment to HPEM Threats
AU - Nitsch, Daniel
AU - Camp, Michael
AU - Sabath, Frank
AU - ter Haseborg, Jan Luiken
AU - Garbe, Heyno
PY - 2004/8/24
Y1 - 2004/8/24
N2 - In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.
AB - In this paper, an overview of the susceptibility of a large number of different electronic devices like computer networks, computer systems, microprocessor boards, microcontrollers, and other basic integrated circuits (ICs) to different threats like electromagnetic pulse (EMP), ultrawideband (UWB), and high-power microwave pulses (HPM) is given. The presented data will include a comparison of the HPM and UWB susceptibility of some devices and a deeper look into the destruction effects in ICs. Therefore, the ICs were opened and the destruction effects were investigated. A norm based approach to describe the threat of different pulses to electronic devices gives a theoretical explanation for the measured susceptibility data.
UR - http://www.scopus.com/inward/record.url?scp=4444322745&partnerID=8YFLogxK
U2 - 10.1109/TEMC.2004.831842
DO - 10.1109/TEMC.2004.831842
M3 - Article
AN - SCOPUS:4444322745
VL - 46
SP - 380
EP - 389
JO - IEEE Transactions on Electromagnetic Compatibility
JF - IEEE Transactions on Electromagnetic Compatibility
SN - 0018-9375
IS - 3
ER -