Details
| Original language | English |
|---|---|
| Title of host publication | 2007 IEEE International Symposium on Electromagnetic Compatibility |
| Subtitle of host publication | EMC |
| Publication status | Published - 2007 |
| Event | IEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, United States Duration: 9 Jul 2007 → 13 Jul 2007 |
Publication series
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| ISSN (Print) | 1077-4076 |
Abstract
The subject of this paper is to investigate the susceptibility of microcontrollers to single transient signals. It is shown that the principle coupling of transient field pulses into electronic systems is limited in bandwidth. In order to investigate the different resulting pulseforms and to estimate the effect on the susceptibility of the electronic devices a setup is presented that gives the opportunity to emulate the field coupling in systems with different coupling sizes. On the degeneration of the disturbing signals by the input impedance of the chip is given attention as well as on the susceptibility of the chip itself.
Keywords
- Breakdown, Coupling, Electronics, Intentional EMI (IEMI), Susceptibility, Transient, Ultrawideband, UWB
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Condensed Matter Physics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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2007 IEEE International Symposium on Electromagnetic Compatibility: EMC. 2007. 4305755 (IEEE International Symposium on Electromagnetic Compatibility).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Susceptibility of Electronic Devices to Variable Transient Spectra
AU - Korte, Sven
AU - Garbe, Heyno
PY - 2007
Y1 - 2007
N2 - The subject of this paper is to investigate the susceptibility of microcontrollers to single transient signals. It is shown that the principle coupling of transient field pulses into electronic systems is limited in bandwidth. In order to investigate the different resulting pulseforms and to estimate the effect on the susceptibility of the electronic devices a setup is presented that gives the opportunity to emulate the field coupling in systems with different coupling sizes. On the degeneration of the disturbing signals by the input impedance of the chip is given attention as well as on the susceptibility of the chip itself.
AB - The subject of this paper is to investigate the susceptibility of microcontrollers to single transient signals. It is shown that the principle coupling of transient field pulses into electronic systems is limited in bandwidth. In order to investigate the different resulting pulseforms and to estimate the effect on the susceptibility of the electronic devices a setup is presented that gives the opportunity to emulate the field coupling in systems with different coupling sizes. On the degeneration of the disturbing signals by the input impedance of the chip is given attention as well as on the susceptibility of the chip itself.
KW - Breakdown
KW - Coupling
KW - Electronics
KW - Intentional EMI (IEMI)
KW - Susceptibility
KW - Transient
KW - Ultrawideband
KW - UWB
UR - http://www.scopus.com/inward/record.url?scp=47749146536&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2007.175
DO - 10.1109/ISEMC.2007.175
M3 - Conference contribution
AN - SCOPUS:47749146536
SN - 1424413508
SN - 9781424413508
T3 - IEEE International Symposium on Electromagnetic Compatibility
BT - 2007 IEEE International Symposium on Electromagnetic Compatibility
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2007
Y2 - 9 July 2007 through 13 July 2007
ER -