Surfactant-mediated growth of germanium on silicon (001) with submonolayer coverage of Sb and Te

Research output: Contribution to journalArticleResearchpeer review

Authors

  • H. J. Osten
  • J. Klatt
  • G. Lippert
  • E. Bugiel
  • S. Higuchi

External Research Organisations

  • Leibniz Institute for High Performance Microelectronics (IHP)
  • Tosoh Corporation
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Details

Original languageEnglish
Pages (from-to)2507-2511
Number of pages5
JournalJournal of applied physics
Volume74
Issue number4
Publication statusPublished - 15 Aug 1993
Externally publishedYes

Abstract

Surfactant-mediated growth of germanium on silicon (001) with submonolayer coverages of antimony and tellurium, respectively, was investigated with reflection high-energy electron diffraction and transmission electron microscopy. Approximately 0.2 monolayer of antimony is needed for a complete suppression of islanding for the growth at 450 °C. For growth at a lower temperature (270 °C), only approximately 10% of a monolayer antimony or tellurium is needed in order to obtain smooth epitaxial germanium layers. No differences could be detected between tellurium and antimony in the behavior as a surfactant. The performed surfactant-mediated growth experiments can be understood as the kinetic suppression of islanding due to a reduction in surface diffusion of germanium adatoms.

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Cite this

Surfactant-mediated growth of germanium on silicon (001) with submonolayer coverage of Sb and Te. / Osten, H. J.; Klatt, J.; Lippert, G. et al.
In: Journal of applied physics, Vol. 74, No. 4, 15.08.1993, p. 2507-2511.

Research output: Contribution to journalArticleResearchpeer review

Osten HJ, Klatt J, Lippert G, Bugiel E, Higuchi S. Surfactant-mediated growth of germanium on silicon (001) with submonolayer coverage of Sb and Te. Journal of applied physics. 1993 Aug 15;74(4):2507-2511. doi: 10.1063/1.354690
Osten, H. J. ; Klatt, J. ; Lippert, G. et al. / Surfactant-mediated growth of germanium on silicon (001) with submonolayer coverage of Sb and Te. In: Journal of applied physics. 1993 ; Vol. 74, No. 4. pp. 2507-2511.
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