Surface passivation of phosphorus-diffused n +-type emitters by plasma-assisted atomic-layer deposited Al 2O 3

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Authors

  • B. Hoex
  • M. C.M. van de Sanden
  • J. Schmidt
  • R. Brendel
  • W. M.M. Kessels

External Research Organisations

  • National University of Singapore
  • Eindhoven University of Technology (TU/e)
  • Institute for Solar Energy Research (ISFH)
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Details

Original languageEnglish
Pages (from-to)4-6
Number of pages3
JournalPhysica Status Solidi - Rapid Research Letters
Volume6
Issue number1
Publication statusPublished - 13 Dec 2011
Externally publishedYes

Abstract

In recent years Al 2O 3 has received tremendous interest in the photovoltaic community for the application as surface passivation layer for crystalline silicon. Especially p-type c-Si surfaces are very effectively passivated by Al 2O 3, including p-type emitters, due to the high fixed negative charge in the Al 2O 3 film. In this Letter we show that Al 2O 3 prepared by plasma-assisted atomic layer deposition (ALD) can actually provide a good level of surface passivation for highly doped n-type emitters in the range of 10-100 Ω/sq with implied-V oc values up to 680 mV. For n-type emitters in the range of 100-200 Ω/sq the implied-V oc drops to a value of 600 mV for a 200 Ω/sq emitter, indicating a decreased level of surface passivation. For even lighter doped n-type surfaces the passivation quality increases again to implied-V oc values well above 700 mV. Hence, the results presented here indicate that within a certain doping range, highly doped n- and p-type surfaces can be passivated simultaneously by Al 2O 3.

Keywords

    Aluminium oxide, N-type emitters, Solar cells, Surface passivation

ASJC Scopus subject areas

Sustainable Development Goals

Cite this

Surface passivation of phosphorus-diffused n +-type emitters by plasma-assisted atomic-layer deposited Al 2O 3. / Hoex, B.; van de Sanden, M. C.M.; Schmidt, J. et al.
In: Physica Status Solidi - Rapid Research Letters, Vol. 6, No. 1, 13.12.2011, p. 4-6.

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abstract = "In recent years Al 2O 3 has received tremendous interest in the photovoltaic community for the application as surface passivation layer for crystalline silicon. Especially p-type c-Si surfaces are very effectively passivated by Al 2O 3, including p-type emitters, due to the high fixed negative charge in the Al 2O 3 film. In this Letter we show that Al 2O 3 prepared by plasma-assisted atomic layer deposition (ALD) can actually provide a good level of surface passivation for highly doped n-type emitters in the range of 10-100 Ω/sq with implied-V oc values up to 680 mV. For n-type emitters in the range of 100-200 Ω/sq the implied-V oc drops to a value of 600 mV for a 200 Ω/sq emitter, indicating a decreased level of surface passivation. For even lighter doped n-type surfaces the passivation quality increases again to implied-V oc values well above 700 mV. Hence, the results presented here indicate that within a certain doping range, highly doped n- and p-type surfaces can be passivated simultaneously by Al 2O 3.",
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AU - Hoex, B.

AU - van de Sanden, M. C.M.

AU - Schmidt, J.

AU - Brendel, R.

AU - Kessels, W. M.M.

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