Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • B. Mangote
  • L. Gallais
  • M. Zerrad
  • M. Commandré
  • L. H. Gao
  • F. Lemarchand
  • M. Lequime
  • A. Melninkaitis
  • J. Mirauskas
  • V. Sirutkaitis
  • S. Kicas
  • T. Tolenis
  • R. Drazdys
  • Mathias Mende
  • Lars Jensen
  • Henrik Ehlers
  • Detlev Ristau

External Research Organisations

  • Ecole Centrale Marseille
  • Vilnius University
  • Center for Physical Sciences and Technology (FTMC)
  • Laser Zentrum Hannover e.V. (LZH)
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Details

Original languageEnglish
Title of host publicationAdvances in Optical Thin Films IV
PublisherSPIE
ISBN (print)9780819487940
Publication statusPublished - 4 Oct 2011
EventAdvances in Optical Thin Films IV - Marseille, France
Duration: 5 Sept 20117 Sept 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8168
ISSN (Print)0277-786X

Abstract

We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.

Keywords

    Laser-induced damage, Mixture coatings, Optical coatings, Oxide coatings, Sub-picosecond pulse

ASJC Scopus subject areas

Cite this

Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. / Mangote, B.; Gallais, L.; Zerrad, M. et al.
Advances in Optical Thin Films IV. SPIE, 2011. 1 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8168).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Mangote, B, Gallais, L, Zerrad, M, Commandré, M, Gao, LH, Lemarchand, F, Lequime, M, Melninkaitis, A, Mirauskas, J, Sirutkaitis, V, Kicas, S, Tolenis, T, Drazdys, R, Mende, M, Jensen, L, Ehlers, H & Ristau, D 2011, Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. in Advances in Optical Thin Films IV., 1, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8168, SPIE, Advances in Optical Thin Films IV, Marseille, France, 5 Sept 2011. https://doi.org/10.1117/12.897372
Mangote, B., Gallais, L., Zerrad, M., Commandré, M., Gao, L. H., Lemarchand, F., Lequime, M., Melninkaitis, A., Mirauskas, J., Sirutkaitis, V., Kicas, S., Tolenis, T., Drazdys, R., Mende, M., Jensen, L., Ehlers, H., & Ristau, D. (2011). Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. In Advances in Optical Thin Films IV Article 1 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8168). SPIE. https://doi.org/10.1117/12.897372
Mangote B, Gallais L, Zerrad M, Commandré M, Gao LH, Lemarchand F et al. Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. In Advances in Optical Thin Films IV. SPIE. 2011. 1. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.897372
Mangote, B. ; Gallais, L. ; Zerrad, M. et al. / Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films. Advances in Optical Thin Films IV. SPIE, 2011. (Proceedings of SPIE - The International Society for Optical Engineering).
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abstract = "We report an experimental investigation in the laser-induced damage threshold (LIDT) of optical coatings materials. The samples are single layers of Al2O3, Nb2O5, HfO2, SiO 2, Ta2O5, ZrO2 deposited through different deposition techniques (evaporation or sputtering with/without ion assistance) and mixtures of Al2O3/SiO2, Nb 2O5/SiO2, HfO2/SiO2, Ta2O5/SiO2 and ZrO2/SiO2 on silica substrates. The LIDT is measured at 1030nm, 500fs in single shot mode. The results are expressed and compared in term of LIDT as a function of bandgap and LIDT as a function of refractive index.",
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T1 - Study of the laser matter interaction in the femtosecond regime. Application to the analysis of the laser damage of optical thin films

AU - Mangote, B.

AU - Gallais, L.

AU - Zerrad, M.

AU - Commandré, M.

AU - Gao, L. H.

AU - Lemarchand, F.

AU - Lequime, M.

AU - Melninkaitis, A.

AU - Mirauskas, J.

AU - Sirutkaitis, V.

AU - Kicas, S.

AU - Tolenis, T.

AU - Drazdys, R.

AU - Mende, Mathias

AU - Jensen, Lars

AU - Ehlers, Henrik

AU - Ristau, Detlev

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KW - Mixture coatings

KW - Optical coatings

KW - Oxide coatings

KW - Sub-picosecond pulse

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