Strong-Field Double Ionization of Ar below the Recollision Threshold

Research output: Contribution to journalArticleResearchpeer review

Authors

  • Yunquan Liu
  • S. Tschuch
  • A. Rudenko
  • M. Dürr
  • M. Siegel
  • U. Morgner
  • R. Moshammer
  • J. Ullrich

Research Organisations

External Research Organisations

  • Max Planck Institute for Nuclear Physics
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Details

Original languageEnglish
Article number053001
JournalPhysical review letters
Volume101
Issue number5
Publication statusPublished - 28 Jul 2008

Abstract

Nonsequential double ionization of Ar by 45 fs laser pulses (800 nm) at (4-7)×1013W/cm2 was explored in fully differential measurements. Well below the field-modified recollision threshold we enter the multiphoton regime. Strongly correlated back-to-back emission of the electrons along the polarization direction is observed to dominate in striking contrast to all previous data. No effect of Coulomb repulsion can be found, the predicted cutoff in the sum-energy spectra of two emitted electrons is confirmed, and the potential importance of multiple recollisions is discussed.

ASJC Scopus subject areas

Cite this

Strong-Field Double Ionization of Ar below the Recollision Threshold. / Liu, Yunquan; Tschuch, S.; Rudenko, A. et al.
In: Physical review letters, Vol. 101, No. 5, 053001, 28.07.2008.

Research output: Contribution to journalArticleResearchpeer review

Liu, Y., Tschuch, S., Rudenko, A., Dürr, M., Siegel, M., Morgner, U., Moshammer, R., & Ullrich, J. (2008). Strong-Field Double Ionization of Ar below the Recollision Threshold. Physical review letters, 101(5), Article 053001. https://doi.org/10.1103/PhysRevLett.101.053001, https://doi.org/10.15488/3296
Liu Y, Tschuch S, Rudenko A, Dürr M, Siegel M, Morgner U et al. Strong-Field Double Ionization of Ar below the Recollision Threshold. Physical review letters. 2008 Jul 28;101(5):053001. doi: 10.1103/PhysRevLett.101.053001, 10.15488/3296
Liu, Yunquan ; Tschuch, S. ; Rudenko, A. et al. / Strong-Field Double Ionization of Ar below the Recollision Threshold. In: Physical review letters. 2008 ; Vol. 101, No. 5.
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AU - Liu, Yunquan

AU - Tschuch, S.

AU - Rudenko, A.

AU - Dürr, M.

AU - Siegel, M.

AU - Morgner, U.

AU - Moshammer, R.

AU - Ullrich, J.

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