Details
| Translated title of the contribution | Dietmar Giselbrecht: Increased sensitivity at near-field measurements on metal housings |
|---|---|
| Original language | German |
| Title of host publication | EMC 2006 |
| Subtitle of host publication | International Trade Fair and Conference on Electromagnetic Compatibility |
| Pages | 245-252 |
| Number of pages | 8 |
| Publication status | Published - 2006 |
| Event | International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 - Düsseldorf, Germany Duration: 7 Mar 2006 → 9 Mar 2006 |
Publication series
| Name | EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility |
|---|
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
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Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. / Reiser, Peter; Garbe, Heyno; Giselbrecht, Dietmar.
EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. p. 245-252 (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. p. 245-252 (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
Reiser, P, Garbe, H & Giselbrecht, D 2006, Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. in EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility, pp. 245-252, International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006, Düsseldorf, Germany, 7 Mar 2006.
Reiser, P., Garbe, H., & Giselbrecht, D. (2006). Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. In EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility (pp. 245-252). (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
Reiser P, Garbe H, Giselbrecht D. Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen. In EMC 2006: International Trade Fair and Conference on Electromagnetic Compatibility. 2006. p. 245-252. (EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility).
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@inproceedings{fdf9d4449d8e4d1fa4a50f6b76fccd62,
title = "Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgeh{\"a}usen",
author = "Peter Reiser and Heyno Garbe and Dietmar Giselbrecht",
year = "2006",
language = "Deutsch",
isbn = "3800729334",
series = "EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility",
pages = "245--252",
booktitle = "EMC 2006",
note = "International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006 ; Conference date: 07-03-2006 Through 09-03-2006",
}
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TY - GEN
T1 - Steigerung der Empfindlichkeit bei Nah-Feld-Messungen an Metallgehäusen
AU - Reiser, Peter
AU - Garbe, Heyno
AU - Giselbrecht, Dietmar
PY - 2006
Y1 - 2006
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M3 - Aufsatz in Konferenzband
AN - SCOPUS:84881423615
SN - 3800729334
SN - 9783800729333
T3 - EMC 2006 - International Trade Fair and Conference on Electromagnetic Compatibility
SP - 245
EP - 252
BT - EMC 2006
T2 - International Trade Fair and Conference on Electromagnetic Compatibility, EMC 2006
Y2 - 7 March 2006 through 9 March 2006
ER -