Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Houssem Abdellatif
  • Bodo Heimann
  • Martin Grotjahn

Research Organisations

External Research Organisations

  • IAV GmbH
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Details

Original languageEnglish
Title of host publicationProceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference
Subtitle of host publicationCDC-ECC '05
Place of PublicationSeville, Spain
Pages3357-3362
Number of pages6
Publication statusPublished - 2005
Event44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05 - Seville, Spain
Duration: 12 Dec 200515 Dec 2005

Abstract

The problem of high measurement noise in identification issue is treated in this paper for an innovative parallel robotic manipulator. To consider the noise and the correlation across the system's output a complete statistical approach is presented. The Maximum-Likelihood estimator is used for the identification of the dynamics parameters. Furthermore the experiments were designed based on a statistical criterion, such that the resulting excitation trajectories minimize the uncertainty bounds of the estimation. The experimental results are consequently compared with those resulting from classic deterministic approaches. This comparison demonstrates that the presented methodology yields bias-free and asymptotic efficient estimation.

ASJC Scopus subject areas

Cite this

Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. / Abdellatif, Houssem; Heimann, Bodo; Grotjahn, Martin.
Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain, 2005. p. 3357-3362 1582680.

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Abdellatif, H, Heimann, B & Grotjahn, M 2005, Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. in Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05., 1582680, Seville, Spain, pp. 3357-3362, 44th IEEE Conference on Decision and Control, and the European Control Conference, CDC-ECC '05, Seville, Spain, 12 Dec 2005. https://doi.org/10.1109/CDC.2005.1582680
Abdellatif, H., Heimann, B., & Grotjahn, M. (2005). Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. In Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05 (pp. 3357-3362). Article 1582680. https://doi.org/10.1109/CDC.2005.1582680
Abdellatif H, Heimann B, Grotjahn M. Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. In Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain. 2005. p. 3357-3362. 1582680 doi: 10.1109/CDC.2005.1582680
Abdellatif, Houssem ; Heimann, Bodo ; Grotjahn, Martin. / Statistical approach for bias-free identification of a parallel manipulator affected by large measurement noise. Proceedings of the 44th IEEE Conference on Decision and Control, and the European Control Conference: CDC-ECC '05. Seville, Spain, 2005. pp. 3357-3362
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