Spin noise spectroscopy in semiconductors

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  • University of Regensburg
  • ETH Zurich
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Details

Original languageEnglish
Title of host publicationSpintronics II
Publication statusPublished - 18 Aug 2009
EventSpintronics II - San Diego, CA, United States
Duration: 2 Aug 20095 Aug 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7398
ISSN (Print)0277-786X

Abstract

We demonstrate spin noise spectroscopy as an efficient and surprisingly sensitive experimental tool to measure the spin dynamics of free and localized carriers in semiconductors. The technique suppresses perturbations and gives access to intrinsic spin relaxation times by omitting optical excitation. We show the power of spin noise spectroscopy for basic physics by measurements on n-type modulation doped (110) GaAs quantum wells. The measurements reveal that the spin relaxation times are limited by stochastic spin-orbit fields and that the spin can be used as marker for the observation of electron diffusion processes at thermal equilibrium. We show the power of spin noise spectroscopy for applied physics, by three dimensional measurements of the doping distribution in direct semiconductors.

Keywords

    Noise, Optics, Semiconductor, Spin dynamics, Spintronics

ASJC Scopus subject areas

Cite this

Spin noise spectroscopy in semiconductors. / Oestreich, Michael; Römer, Michael; Müller, Georg et al.
Spintronics II. 2009. 739802 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7398).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Oestreich, M, Römer, M, Müller, G, Schuh, D, Wegscheider, W & Hübner, J 2009, Spin noise spectroscopy in semiconductors. in Spintronics II., 739802, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7398, Spintronics II, San Diego, CA, United States, 2 Aug 2009. https://doi.org/10.1117/12.824177
Oestreich, M., Römer, M., Müller, G., Schuh, D., Wegscheider, W., & Hübner, J. (2009). Spin noise spectroscopy in semiconductors. In Spintronics II Article 739802 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7398). https://doi.org/10.1117/12.824177
Oestreich M, Römer M, Müller G, Schuh D, Wegscheider W, Hübner J. Spin noise spectroscopy in semiconductors. In Spintronics II. 2009. 739802. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.824177
Oestreich, Michael ; Römer, Michael ; Müller, Georg et al. / Spin noise spectroscopy in semiconductors. Spintronics II. 2009. (Proceedings of SPIE - The International Society for Optical Engineering).
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AU - Oestreich, Michael

AU - Römer, Michael

AU - Müller, Georg

AU - Schuh, Dieter

AU - Wegscheider, Werner

AU - Hübner, Jens

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AB - We demonstrate spin noise spectroscopy as an efficient and surprisingly sensitive experimental tool to measure the spin dynamics of free and localized carriers in semiconductors. The technique suppresses perturbations and gives access to intrinsic spin relaxation times by omitting optical excitation. We show the power of spin noise spectroscopy for basic physics by measurements on n-type modulation doped (110) GaAs quantum wells. The measurements reveal that the spin relaxation times are limited by stochastic spin-orbit fields and that the spin can be used as marker for the observation of electron diffusion processes at thermal equilibrium. We show the power of spin noise spectroscopy for applied physics, by three dimensional measurements of the doping distribution in direct semiconductors.

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