Spectrophotometric characterization of gradient index coatings

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Stefan Günster
  • Manfred Dieckmann
  • Detlev Ristau
  • David Le Bellac

External Research Organisations

  • Laser Zentrum Hannover e.V. (LZH)
View graph of relations

Details

Original languageEnglish
Title of host publicationAdvances in optical interference coatings
Subtitle of host publication25 - 27 May 1999, Berlin, Germany
Place of PublicationBellingham
PublisherSPIE
Pages529-538
Number of pages10
ISBN (print)0-8194-3212-1
Publication statusPublished - 7 Sept 1999
Externally publishedYes
Event1999 Advances in Optical Interference Coatings - Berlin, Ger
Duration: 25 May 199927 May 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume3738
ISSN (Print)0277-786X

Abstract

The deposition of gradient index coatings attaches a higher importance for science and also for industrial applications. Especially the progress in chemical vapour deposition technologies opens new opportunities for the production of various types of gradient index coatings. However, the characterization of these types of coatings plays a substantial role in the optimization of coating processes. The spectrophotometric characterization and analysis of gradient index layer coatings is described. SiOxNy gradient index coatings were produced in a CVD process, and gradient index TiO2 layers in an e-beam deposition process with varying ion bombardment. A set of transmission and reflection spectra for different angles of incidence and polarization states was measured. The subsequent data evaluation employs a multilayer model for the gradient index layer to calculate the corresponding spectra. The analysing procedure optimizes the layer system with respect to a minimum deviation between calculated and experimental data. Refractive index data and layer thickness are adapted. Results of gradient index layer systems, three layer coating systems, and homogeneous single layers are presented. The experimental spectra are presented in comparison to the corresponding spectra calculated from the evaluated coating design. The evaluated behaviour of the refractive indices in dependence of the film thickness is discussed in view of the original design for the production process. Also, the influence of measurement errors on the data extraction is demonstrated, as well as the effect of the starting parameters. A good agreement between the simulated and experimental data could be achieved for the gradient index layer system, which demonstrates the versatility of the characterization procedure.

ASJC Scopus subject areas

Cite this

Spectrophotometric characterization of gradient index coatings. / Günster, Stefan; Dieckmann, Manfred; Ristau, Detlev et al.
Advances in optical interference coatings: 25 - 27 May 1999, Berlin, Germany. Bellingham: SPIE, 1999. p. 529-538 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3738).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Günster, S, Dieckmann, M, Ristau, D & Le Bellac, D 1999, Spectrophotometric characterization of gradient index coatings. in Advances in optical interference coatings: 25 - 27 May 1999, Berlin, Germany. Proceedings of SPIE - The International Society for Optical Engineering, vol. 3738, SPIE, Bellingham, pp. 529-538, 1999 Advances in Optical Interference Coatings, Berlin, Ger, 25 May 1999. https://doi.org/10.1117/12.360124
Günster, S., Dieckmann, M., Ristau, D., & Le Bellac, D. (1999). Spectrophotometric characterization of gradient index coatings. In Advances in optical interference coatings: 25 - 27 May 1999, Berlin, Germany (pp. 529-538). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3738). SPIE. https://doi.org/10.1117/12.360124
Günster S, Dieckmann M, Ristau D, Le Bellac D. Spectrophotometric characterization of gradient index coatings. In Advances in optical interference coatings: 25 - 27 May 1999, Berlin, Germany. Bellingham: SPIE. 1999. p. 529-538. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.360124
Günster, Stefan ; Dieckmann, Manfred ; Ristau, Detlev et al. / Spectrophotometric characterization of gradient index coatings. Advances in optical interference coatings: 25 - 27 May 1999, Berlin, Germany. Bellingham : SPIE, 1999. pp. 529-538 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
@inproceedings{ca7d2b32f80f411fb0f5aeb99feb4fd9,
title = "Spectrophotometric characterization of gradient index coatings",
abstract = "The deposition of gradient index coatings attaches a higher importance for science and also for industrial applications. Especially the progress in chemical vapour deposition technologies opens new opportunities for the production of various types of gradient index coatings. However, the characterization of these types of coatings plays a substantial role in the optimization of coating processes. The spectrophotometric characterization and analysis of gradient index layer coatings is described. SiOxNy gradient index coatings were produced in a CVD process, and gradient index TiO2 layers in an e-beam deposition process with varying ion bombardment. A set of transmission and reflection spectra for different angles of incidence and polarization states was measured. The subsequent data evaluation employs a multilayer model for the gradient index layer to calculate the corresponding spectra. The analysing procedure optimizes the layer system with respect to a minimum deviation between calculated and experimental data. Refractive index data and layer thickness are adapted. Results of gradient index layer systems, three layer coating systems, and homogeneous single layers are presented. The experimental spectra are presented in comparison to the corresponding spectra calculated from the evaluated coating design. The evaluated behaviour of the refractive indices in dependence of the film thickness is discussed in view of the original design for the production process. Also, the influence of measurement errors on the data extraction is demonstrated, as well as the effect of the starting parameters. A good agreement between the simulated and experimental data could be achieved for the gradient index layer system, which demonstrates the versatility of the characterization procedure.",
author = "Stefan G{\"u}nster and Manfred Dieckmann and Detlev Ristau and {Le Bellac}, David",
year = "1999",
month = sep,
day = "7",
doi = "10.1117/12.360124",
language = "English",
isbn = "0-8194-3212-1",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "529--538",
booktitle = "Advances in optical interference coatings",
address = "United States",
note = "1999 Advances in Optical Interference Coatings ; Conference date: 25-05-1999 Through 27-05-1999",

}

Download

TY - GEN

T1 - Spectrophotometric characterization of gradient index coatings

AU - Günster, Stefan

AU - Dieckmann, Manfred

AU - Ristau, Detlev

AU - Le Bellac, David

PY - 1999/9/7

Y1 - 1999/9/7

N2 - The deposition of gradient index coatings attaches a higher importance for science and also for industrial applications. Especially the progress in chemical vapour deposition technologies opens new opportunities for the production of various types of gradient index coatings. However, the characterization of these types of coatings plays a substantial role in the optimization of coating processes. The spectrophotometric characterization and analysis of gradient index layer coatings is described. SiOxNy gradient index coatings were produced in a CVD process, and gradient index TiO2 layers in an e-beam deposition process with varying ion bombardment. A set of transmission and reflection spectra for different angles of incidence and polarization states was measured. The subsequent data evaluation employs a multilayer model for the gradient index layer to calculate the corresponding spectra. The analysing procedure optimizes the layer system with respect to a minimum deviation between calculated and experimental data. Refractive index data and layer thickness are adapted. Results of gradient index layer systems, three layer coating systems, and homogeneous single layers are presented. The experimental spectra are presented in comparison to the corresponding spectra calculated from the evaluated coating design. The evaluated behaviour of the refractive indices in dependence of the film thickness is discussed in view of the original design for the production process. Also, the influence of measurement errors on the data extraction is demonstrated, as well as the effect of the starting parameters. A good agreement between the simulated and experimental data could be achieved for the gradient index layer system, which demonstrates the versatility of the characterization procedure.

AB - The deposition of gradient index coatings attaches a higher importance for science and also for industrial applications. Especially the progress in chemical vapour deposition technologies opens new opportunities for the production of various types of gradient index coatings. However, the characterization of these types of coatings plays a substantial role in the optimization of coating processes. The spectrophotometric characterization and analysis of gradient index layer coatings is described. SiOxNy gradient index coatings were produced in a CVD process, and gradient index TiO2 layers in an e-beam deposition process with varying ion bombardment. A set of transmission and reflection spectra for different angles of incidence and polarization states was measured. The subsequent data evaluation employs a multilayer model for the gradient index layer to calculate the corresponding spectra. The analysing procedure optimizes the layer system with respect to a minimum deviation between calculated and experimental data. Refractive index data and layer thickness are adapted. Results of gradient index layer systems, three layer coating systems, and homogeneous single layers are presented. The experimental spectra are presented in comparison to the corresponding spectra calculated from the evaluated coating design. The evaluated behaviour of the refractive indices in dependence of the film thickness is discussed in view of the original design for the production process. Also, the influence of measurement errors on the data extraction is demonstrated, as well as the effect of the starting parameters. A good agreement between the simulated and experimental data could be achieved for the gradient index layer system, which demonstrates the versatility of the characterization procedure.

UR - http://www.scopus.com/inward/record.url?scp=0032685599&partnerID=8YFLogxK

U2 - 10.1117/12.360124

DO - 10.1117/12.360124

M3 - Conference contribution

AN - SCOPUS:0032685599

SN - 0-8194-3212-1

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 529

EP - 538

BT - Advances in optical interference coatings

PB - SPIE

CY - Bellingham

T2 - 1999 Advances in Optical Interference Coatings

Y2 - 25 May 1999 through 27 May 1999

ER -