Shot noise in tunneling through a single quantum dot

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Original languageEnglish
Article number033305
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume70
Issue number3
Publication statusPublished - 13 Jul 2004

Abstract

We investigate the noise properties of a zero-dimensional InAs quantum dot (QD) embedded in a GaAs-AlAs-GaAs tunneling structure. We observe an approximately linear dependence of the Fano factor and the current as a function of bias voltage. Both effects can be linked to the scanning of the three-dimensional emitter density of states by the QD. At the current step the shape of the Fano factor is mainly determined by the Fermi function of the emitter electrons. The observed voltage and temperature dependence is compared to the results of a master equation approach.

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Shot noise in tunneling through a single quantum dot. / Nauen, A.; Hohls, F.; Maire, N. et al.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 70, No. 3, 033305, 13.07.2004.

Research output: Contribution to journalArticleResearchpeer review

Nauen A, Hohls F, Maire N, Pierz K, Haug RJ. Shot noise in tunneling through a single quantum dot. Physical Review B - Condensed Matter and Materials Physics. 2004 Jul 13;70(3):033305. doi: 10.1103/PhysRevB.70.033305, 10.15488/2849
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AU - Hohls, F.

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AU - Pierz, K.

AU - Haug, R. J.

N1 - Funding information: The authors would like to thank Gerold Kiesslich for enlightening discussions. We acknowledge financial support from DFG and BMBF.

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