Details
Original language | English |
---|---|
Title of host publication | ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application |
Pages | 514-517 |
Number of pages | 4 |
Publication status | Published - 26 Nov 2012 |
Event | 2012 International Conference on High Voltage Engineering and Application, ICHVE 2012 - Shanghai, China Duration: 17 Sept 2012 → 20 Sept 2012 |
Publication series
Name | ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application |
---|
Abstract
In the presence of arc, partial discharge and thermal discharge, SF 6 decomposes into a wide variety of active products which possess different chemical properties. This paper reports on research in SF6 decomposition relating to the ageing- and fault problems of the insulating materials in the gas-insulated equipment. Under the guidance of detection technology, the decomposition mechanism and the decomposed constituent of SF6 are analysed. The qualitative and quantitative determinations of the by-products are studied according to various modes of electrical discharges. In particular, the influence of discharge energies and impurities on the formation of the dominant stable by-products is discussed. According to the characteristic products, the internal fault inside gas insulated switchgear can be determined for fault diagnosis of SF6 equipment.
ASJC Scopus subject areas
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
- Standard
- Harvard
- Apa
- Vancouver
- BibTeX
- RIS
ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application. 2012. p. 514-517 6357039 (ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - SF6 decomposition and fault type in SF6 gas insulated equipment
AU - Zhang, X.
AU - Gockenbach, Ernst
AU - Wang, C. Y.
AU - Song, G.
AU - Yan, X. L.
AU - Ji, Y. S.
AU - Yang, R.
AU - Su, Z. X.
AU - Yao, Q.
AU - Chen, H. L.
AU - Lu, G.
PY - 2012/11/26
Y1 - 2012/11/26
N2 - In the presence of arc, partial discharge and thermal discharge, SF 6 decomposes into a wide variety of active products which possess different chemical properties. This paper reports on research in SF6 decomposition relating to the ageing- and fault problems of the insulating materials in the gas-insulated equipment. Under the guidance of detection technology, the decomposition mechanism and the decomposed constituent of SF6 are analysed. The qualitative and quantitative determinations of the by-products are studied according to various modes of electrical discharges. In particular, the influence of discharge energies and impurities on the formation of the dominant stable by-products is discussed. According to the characteristic products, the internal fault inside gas insulated switchgear can be determined for fault diagnosis of SF6 equipment.
AB - In the presence of arc, partial discharge and thermal discharge, SF 6 decomposes into a wide variety of active products which possess different chemical properties. This paper reports on research in SF6 decomposition relating to the ageing- and fault problems of the insulating materials in the gas-insulated equipment. Under the guidance of detection technology, the decomposition mechanism and the decomposed constituent of SF6 are analysed. The qualitative and quantitative determinations of the by-products are studied according to various modes of electrical discharges. In particular, the influence of discharge energies and impurities on the formation of the dominant stable by-products is discussed. According to the characteristic products, the internal fault inside gas insulated switchgear can be determined for fault diagnosis of SF6 equipment.
UR - http://www.scopus.com/inward/record.url?scp=84871585092&partnerID=8YFLogxK
U2 - 10.1109/ICHVE.2012.6357039
DO - 10.1109/ICHVE.2012.6357039
M3 - Conference contribution
AN - SCOPUS:84871585092
SN - 9781467347464
T3 - ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application
SP - 514
EP - 517
BT - ICHVE 2012 - 2012 International Conference on High Voltage Engineering and Application
T2 - 2012 International Conference on High Voltage Engineering and Application, ICHVE 2012
Y2 - 17 September 2012 through 20 September 2012
ER -