Details
| Original language | English |
|---|---|
| Number of pages | 234 |
| ISBN (electronic) | 9781498743822 |
| Publication status | Published - 25 Nov 2016 |
Abstract
This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
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2016. 234 p.
Research output: Book/Report › Monograph › Research › peer review
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TY - BOOK
T1 - Semiconductor devices in harsh conditions
AU - Weide-Zaage, Kirsten
AU - Chrzanowska-Jeske, Małgorzata
N1 - Publisher Copyright: © 2017 by Taylor & Francis Group, LLC. All rights reserved. Copyright: Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2016/11/25
Y1 - 2016/11/25
N2 - This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.
AB - This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.
UR - http://www.scopus.com/inward/record.url?scp=85029163975&partnerID=8YFLogxK
U2 - 10.1201/9781315368948
DO - 10.1201/9781315368948
M3 - Monograph
AN - SCOPUS:85029163975
SN - 9781498743808
BT - Semiconductor devices in harsh conditions
ER -