1541 - 1560 out of 1,787Page size: 20

1787 Results

  1. 2000

  2. Fuzzy structural analysis using α-level optimization

    Möller, B., Graf, W. & Beer, M., Dec 2000, In: Computational mechanics. 26, 6, p. 547-565 19 p.

    Research output: Contribution to journal › Article › Research › peer review

  3. Published

    Robust optimal onboard reentry guidance of a space shuttle: Dynamic game approach and guidance synthesis via neural networks

    Breitner, M. H., Dec 2000, In: Journal of Optimization Theory and Applications. 107, 3, p. 481-503 23 p.

    Research output: Contribution to journal › Article › Research › peer review

  4. Published

    Contact with friction between beams in 3-D space

    Zavarise, G. & Wriggers, P., 20 Nov 2000, In: International Journal for Numerical Methods in Engineering. 49, 8, p. 977-1006 30 p.

    Research output: Contribution to journal › Article › Research › peer review

  5. Published

    Intrastromal cutting effects in rabbit cornea using femtosecond laser pulses

    Heisterkamp, A., Ripken, T., Lubatschowski, H., Welling, H., Lütkefels, E., Drommer, W. & Ertmer, W., 16 Nov 2000, Optical Biopsy and Tissue Optics. SPIE, p. 52-60 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4161).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  6. Published

    Optoacoust ical Tissue D ifferentiat ion For On-Line Therapy Control

    Oberheide, U., Jansen, B., Bruder, I., Lubatschowski, H., Welling, H. & Ertmer, W., 16 Nov 2000, Optical Biopsy and Tissue Optics. SPIE, p. 37-45 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4161).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  7. Investigation on total scattering at 157 nm and 193 nm

    Kadkhoda, P., Welling, H., Guenster, S. & Ristau, D., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 65-73 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  8. Investigations of transmittance and reflectance in the DUV/VUV spectral range

    Kadkhoda, P., Blaschke, H., Kohlhaas, J. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 311-318 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  9. Microroughness analysis of thin film components for VUV applications

    Ferré-Borrull, J., Duparŕ, A., Steinert, J., Ristau, D. & Quesnel, E., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries: 30 - 31 July 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 82-90 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  10. New procedure for the optical characterization of high-quality thin films

    Bosch, S., Leinfellner, N., Quesnel, E., Duparré, A., Ferré-Borrull, J., Günster, S. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. 1 ed. Bellingham: SPIE, p. 124-130 7 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  11. Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF2 and LaF3 thin films

    Guenster, S., Ristau, D. & Bosch-Puig, S., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 299-310 12 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  12. Standardization in optics characterization

    Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 91-109 19 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  13. Optical characterization of materials deposited by different processes: The LaF3 in the UV-visible region

    Bosch, S., Leinfellner, N., Quesnel, E., Duparre, A., Ferre-Borrull, J., Guenster, S. & Ristau, D., 19 Oct 2000, Optical and Infrared Thin Films: 1 August 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 15-22 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4094).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  14. Rapid prototyping of optical thin film filters

    Starke, K., Gross, T., Lappschies, M. & Ristau, D., 19 Oct 2000, Optical and infrared thin films: 1 August 2000, San Diego, USA. Bellingham: SPIE, p. 83-92 10 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4094).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  15. Pseudo-elastic flexure-hinges in robots for micro assembly

    Hesselbach, J. & Raatz, A., 11 Oct 2000, Microrobotics and microassembly II: 5 - 6 November 2000, Boston, USA. Bellingham: SPIE, p. 157-167 11 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4194).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  16. Published

    Elimination techniques: From extrapolation to totally positive matrices and CAGD

    Gasca, M. & Mühlbach, G., 1 Oct 2000, In: Journal of Computational and Applied Mathematics. 122, 1-2, p. 37-50 14 p.

    Research output: Contribution to journal › Article › Research › peer review

  17. Published

    Interpolation by Cauchy-Vandermonde systems and applications

    Mühlbach, G., 1 Oct 2000, In: Journal of Computational and Applied Mathematics. 122, 1, p. 203-222 20 p.

    Research output: Contribution to journal › Article › Research › peer review

  18. Published

    On the sensitivity of homogenized material responses at infinitesimal and finite strains

    Zohdi, T. I. & Wriggers, P., 18 Aug 2000, In: Communications in Numerical Methods in Engineering. 16, 9, p. 657-670 14 p.

    Research output: Contribution to journal › Article › Research › peer review

  19. Published

    Intrastromal refractive surgery by ultrashort laser pulses: Side effects and mechanisms

    Heisterkamp, A., Maatz, G., Ripken, T., Lubatschowski, H., Welling, H., Luetkefels, E., Drommer, W. & Ertmer, W., 7 Jun 2000, Ophthalmic Technologies X. SPIE, p. 146-156 11 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3908).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  20. Published

    Optoacoustic Tomography As a Diagnostic Tool for Transscleral Laser Cyclophotocoagulation

    Oberheide, U., Buesching, A., Bruder, I., Lubatschowski, H., Welling, H. & Ertmer, W., 7 Jun 2000, Ophthalmic Technologies X. SPIE, p. 60-68 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3908).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  21. Published

    Parametric location-scale and scale trend tests based on Levene's transformation

    Neuhäuser, M. & Hothorn, L. A., 28 Apr 2000, In: Computational Statistics and Data Analysis. 33, 2, p. 189-200 12 p.

    Research output: Contribution to journal › Article › Research › peer review

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