4480 Results

1. 1999

2. Benchmark catalog for numerical field calculations with respect to EMC problems

   Mrozynski, G., Schulz, V. & Garbe, H., 1999, In: IEEE International Symposium on Electromagnetic Compatibility. 1, p. 497-502 6 p.

   Research output: Contribution to journal › Conference article › Research › peer review

3. Carbon doped SiGe heterojunction bipolar transistors for high frequency applications

   Osten, H. J., Knoll, D., Heinemann, B., Ruecker, H. & Tillack, B., 1999, p. 109-116. 8 p.

   Research output: Contribution to conference › Paper › Research › peer review

4. Published

   Characterization of loaded TEM-waveguides using time-domain reflectometry

   Kärst, J. P. & Garbe, H., 1999, IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., p. 127-132 6 p. 812881. (IEEE International Symposium on Electromagnetic Compatibility; vol. 1).

   Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

5. Published

   Determination of the electrical properties of mixed transformer fluids under thermal ageing

   Fofana, I., Wasserberg, V., Borsi, H. & Gockenbach, E., 1999, IEE Conference Publication. 467 ed. p. 3.360.P4-3.363.P4 (IEE Conference Publication; vol. 3, no. 467).

   Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

6. Dopant diffusion in C-doped Si and SiGe: physical model and experimental verification

   Ruecker, H., Heinemann, B., Bolze, D., Knoll, D., Krueger, D., Kurps, R., Osten, H. J., Schley, P., Tillack, B. & Zaumseil, P., 1999, In: Technical Digest - International Electron Devices Meeting. p. 345-348 4 p.

   Research output: Contribution to journal › Conference article › Research › peer review

7. Published

   Hierarchical cluster analysis of broadband measured partial discharges as part of a modular structured monitoring system for transformers

   Werle, P., Borsi, H. & Gockenbach, E., 1999, IEE Conference Publication. 467 ed. p. 5.29.S8-5.32.S8 (IEE Conference Publication; vol. 5, no. 467).

   Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

8. Published

   Higher order mode behavior in loaded and unloaded TEM cells

   Groh, C., Garbe, H. & Koch, M., 1999, IEEE International Symposium on Electromagnetic Compatibility. Institute of Electrical and Electronics Engineers Inc., p. 225-230 6 p. 812899. (IEEE International Symposium on Electromagnetic Compatibility; vol. 1).

   Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

9. Published

   Impact of FEM simulation on reliability improvement of packaging

   Weide, K., 1999, In: Microelectronics reliability. 39, 6-7, p. 1079-1088 10 p.

   Research output: Contribution to journal › Conference article › Research › peer review

10. Published

    Implementation of real-time SAR-systems with a high performance digital signal processor

    Kloos, H., Wittenburg, J. P., Hinrichs, W., Lieske, H. & Pirsch, P., 1999, In: Proceedings of SPIE - The International Society for Optical Engineering. 3871, p. 343-347 5 p.

    Research output: Contribution to journal › Conference article › Research › peer review

11. Published

    Influence of the substrate resistivity on the broadband propagation characteristics of silicon transmission lines

    Arz, U., Grabinski, H. & Williams, D. F., 1999, 54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999. Institute of Electrical and Electronics Engineers Inc., 4120066. (54th ARFTG Conference Digest Fall 1999: Automatic RF Techniques Group: Characterization of Broadband Access Technologies, ARFTG Fall 1999).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

12. Measurement of optical absorptance according to ISO 11551: Parallel round-robin test at 10.6 μm

    Ristau, D., Willamowski, U. & Welling, H., 1999, Laser-induced damage in optical materials: 1998 : proceedings. Bellingham: SPIE, p. 657-670 14 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3578).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

13. Published

    Memory organization of a single-chip video signal processing system with embedded DRAM

    Hilgenstock, J., Herrmann, K. & Pirsch, P., 1999, Proceedings of the IEEE Great Lakes Symposium on VLSI. p. 42-45 4 p. (Proceedings of the IEEE Great Lakes Symposium on VLSI).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

14. Methods and tools for the design of novel multi-functional automotive lighting

    Boernchen, T., Lachmayer, R. & Wallaschek, J., 1999, p. 819-825. 7 p.

    Research output: Contribution to conference › Paper › Research › peer review

15. New medium voltage drive systems using three-level neutral point clamped inverter with high voltage IGBT

    Sommer, R., Mertens, A., Griggs, M., Conraths, H. J., Bruckmann, M. & Greif, T., 1999, In: Conference Record - IAS Annual Meeting (IEEE Industry Applications Society). 3, p. 1513-1519 7 p.

    Research output: Contribution to journal › Conference article › Research › peer review

16. Published

    New method of determining the mean curve of lightning impulses according to IEC 60060-1

    Brede, A. P., Werle, P., Gockenbach, E. & Borsi, H., 1999, IEE Conference Publication. 467 ed. p. 1.74.S29-1.77.S21 (IEE Conference Publication; vol. 1, no. 467).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

17. Published

    Testing and monitoring as basis of the dielectric diagnostic

    Gockenbach, E., 1999, IEE Conference Publication. 467 ed. p. 5.1.S10-5.5.S10 (IEE Conference Publication; vol. 5, no. 467).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

18. Published

    Today's problems with the evaluation methods of full lightning impulse parameters as described in IEC 60060-1

    Berlijn, S., Kvarngren, M., Garnacho, F., Simon, P., Gockenbach, E., Werle, P., Hackemack, K., Watts, M. & Wong, K. C. P., 1999, IEE Conference Publication. 467 ed. p. 1.49.S3-1.52.S3 (IEE Conference Publication; vol. 1, no. 467).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

19. Wireless communication integrated circuits with CMOS-compatible SiGe HBT technology modules

    Winkler, W., Borngraeber, J., Erzgraeber, H., Erzgraeber, H., Heinemann, B., Knoll, D., Osten, H. J., Pierschel, M., Pressel, K. & Schley, P., 1999, Proceedings of the Custom Integrated Circuits Conference. p. 351-358 8 p. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

20. 1998

21. Easy-to-use surface passivation technique for bulk carrier lifetime measurements on silicon wafers

    Schmidt, J. & Aberle, A. G., 21 Dec 1998, In: Progress in Photovoltaics: Research and Applications. 6, 4, p. 259-263 5 p.

    Research output: Contribution to journal › Article › Research › peer review

22. Measuring the absolute absorptance of optical laser components

    Willamowski, U., Ristau, D. & Welsch, E., 20 Dec 1998, In: Applied Optics. 37, 36, p. 8362-8370 9 p.

    Research output: Contribution to journal › Article › Research › peer review