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4464 Results

  1. 2000

  2. Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide

    Kerr, M., Schmidt, J. & Cuevas, A., 2 Nov 2000, In: Progress in Photovoltaics: Research and Applications. 8, 5, p. 529-536 8 p.

    Research output: Contribution to journal › Article › Research › peer review

  3. Investigation on total scattering at 157 nm and 193 nm

    Kadkhoda, P., Welling, H., Guenster, S. & Ristau, D., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 65-73 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  4. Investigations of transmittance and reflectance in the DUV/VUV spectral range

    Kadkhoda, P., Blaschke, H., Kohlhaas, J. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 311-318 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  5. Microroughness analysis of thin film components for VUV applications

    Ferré-Borrull, J., Duparŕ, A., Steinert, J., Ristau, D. & Quesnel, E., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries: 30 - 31 July 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 82-90 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  6. New procedure for the optical characterization of high-quality thin films

    Bosch, S., Leinfellner, N., Quesnel, E., Duparré, A., Ferré-Borrull, J., Günster, S. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. 1 ed. Bellingham: SPIE, p. 124-130 7 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  7. Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF2 and LaF3 thin films

    Guenster, S., Ristau, D. & Bosch-Puig, S., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 299-310 12 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  8. Standardization in optics characterization

    Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 91-109 19 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  9. Micro flame spectrometer

    Zimmermann, S. & Müller, J., Nov 2000, In: Microsystem Technologies. 6, 6, p. 241-245 5 p.

    Research output: Contribution to journal › Article › Research › peer review

  10. Published

    Selection of the frequency range for high-voltage on-site testing of extruded insulation cable systems

    Gockenbach, E. & Hauschild, W., Nov 2000, In: IEEE Electrical Insulation Magazine. 16, 6, p. 11-16 6 p.

    Research output: Contribution to journal › Article › Research › peer review

  11. Optical characterization of materials deposited by different processes: The LaF3 in the UV-visible region

    Bosch, S., Leinfellner, N., Quesnel, E., Duparre, A., Ferre-Borrull, J., Guenster, S. & Ristau, D., 19 Oct 2000, Optical and Infrared Thin Films: 1 August 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 15-22 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4094).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  12. Rapid prototyping of optical thin film filters

    Starke, K., Gross, T., Lappschies, M. & Ristau, D., 19 Oct 2000, Optical and infrared thin films: 1 August 2000, San Diego, USA. Bellingham: SPIE, p. 83-92 10 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4094).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  13. Published

    Setup of a fiber optical oxygen multisensor-system and its applications in biotechnology

    Kohls, O. & Scheper, T., 16 Oct 2000, In: Sensors and Actuators, B: Chemical. 70, 1-3, p. 121-130 10 p.

    Research output: Contribution to journal › Article › Research › peer review

  14. Pseudo-elastic flexure-hinges in robots for micro assembly

    Hesselbach, J. & Raatz, A., 11 Oct 2000, Microrobotics and microassembly II: 5 - 6 November 2000, Boston, USA. Bellingham: SPIE, p. 157-167 11 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4194).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  15. International round-robin experiment to test the International Organization for Standardization total-scattering draft standard

    Kadkhoda, P., Müller, A., Ristau, D., Duparré, A., Gliech, S., Lauth, H., Schuhmann, U., Reng, N., Tilsch, M., Schuhmann, R., Amra, C., Deumie, C., Jolie, C., Kessler, H., Lindström, T., Ribbing, C. G. & Bennett, J. M., 1 Jul 2000, In: Applied Optics. 39, 19, p. 3321-3332 12 p.

    Research output: Contribution to journal › Article › Research › peer review

  16. Published

    1.3-GOPS parallel DSP for high-performance image-processing applications

    Hinrichs, W., Wittenburg, J. P., Lieske, H., Kloos, H., Ohmacht, M. & Pirsch, P., Jul 2000, In: IEEE Journal of Solid-State Circuits. 35, 7, p. 946-952 7 p.

    Research output: Contribution to journal › Article › Research › peer review

  17. Published

    Intrastromal refractive surgery by ultrashort laser pulses: Side effects and mechanisms

    Heisterkamp, A., Maatz, G., Ripken, T., Lubatschowski, H., Welling, H., Luetkefels, E., Drommer, W. & Ertmer, W., 7 Jun 2000, Ophthalmic Technologies X. SPIE, p. 146-156 11 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3908).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  18. Published

    Optoacoustic Tomography As a Diagnostic Tool for Transscleral Laser Cyclophotocoagulation

    Oberheide, U., Buesching, A., Bruder, I., Lubatschowski, H., Welling, H. & Ertmer, W., 7 Jun 2000, Ophthalmic Technologies X. SPIE, p. 60-68 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 3908).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  19. Band offset predictions for strained group IV alloys: Si1-x-yGexCy on Si(001) and Si1-xGex on Si1-zGez(001)

    Galdin, S., Dollfus, P., Aubry-Fortuna, V., Hesto, P. & Osten, H. J., 6 Jun 2000, In: Semiconductor Science and Technology. 15, 6, p. 565-572 8 p.

    Research output: Contribution to journal › Article › Research › peer review

  20. Published

    Experimental demonstration of negative dispersion without absorption

    Wicht, A., Müller, M., Rinkleff, R. H., Rocco, A. & Danzmann, K., 25 May 2000, In: Optics communications. 179, 1, p. 107-115 9 p.

    Research output: Contribution to journal › Article › Research › peer review

  21. Applications of medium voltage drives with IGBT three-level inverter

    Mertens, A., Sommer, R. & Brunette, C., 11 May 2000, In: IEE Colloquium (Digest). 63, p. 51-55 5 p.

    Research output: Contribution to journal › Article › Research › peer review

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