2881 - 2900 out of 3,385Page size: 20

3385 Results

  1. 2001
  2. Published

    Li diffusion in nano- and microcrystalline (1-x)Li2O:xB2O3

    Indris, S., Heitjans, P., Roman, H. E. & Bunde, A., 2001, In: Defect and Diffusion Forum. 194-199, p. 935-940 6 p.

    Research output: Contribution to journal › Article › Research › peer review

  3. Published

    Reduction of MoM matrix dimension by transmission line and circuit theory

    Keller, U., John, W. & Garbe, H., 2001, In: IEEE International Symposium on Electromagnetic Compatibility. 1, p. 605-610 6 p.

    Research output: Contribution to journal › Conference article › Research › peer review

  4. Speeding up CMOS cameras and optical receivers by improved column multiplexer

    Wicht, B., Martiny, I., Schmitt-Landsiedel, D., Paul, S. & Sanders, A., 2001, In: Proceedings of SPIE-The International Society for Optical Engineering. 4290, p. 28-37 10 p.

    Research output: Contribution to journal › Article › Research › peer review

  5. The effect of twinning and slip on the bauschinger effect of hadfield steel single crystals

    Karaman, I., Sehitoglu., H., Chumlyakov, Y. I., Maier, H. J. & Kireeva, I. V., 2001, In: Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science. 32, 13, p. 695-706 12 p.

    Research output: Contribution to journal › Article › Research › peer review

  6. Published

    UWB and EMP susceptibility of modern electronics

    Camp, M., Garbe, H. & Nitsch, D., 2001, In: IEEE International Symposium on Electromagnetic Compatibility. 2, p. 1015-1020 6 p.

    Research output: Contribution to journal › Conference article › Research › peer review

  7. 2000

  8. Multicollision-induced dissociation of multiply charged gold clusters, Au(n)/2+, n = 7-35, and Au(n)/3+, n = 19-35

    Ziegler, J., Dietrich, G., Krückeberg, S., Lützenkirchen, K., Schweikhard, L. & Walther, C., 27 Nov 2000, In: International Journal of Mass Spectrometry. 202, 1-3, p. 47-54 8 p.

    Research output: Contribution to journal › Article › Research › peer review

  9. Published

    Intrastromal cutting effects in rabbit cornea using femtosecond laser pulses

    Heisterkamp, A., Ripken, T., Lubatschowski, H., Welling, H., Lütkefels, E., Drommer, W. & Ertmer, W., 16 Nov 2000, Optical Biopsy and Tissue Optics. SPIE, p. 52-60 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4161).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  10. Published

    Optoacoust ical Tissue D ifferentiat ion For On-Line Therapy Control

    Oberheide, U., Jansen, B., Bruder, I., Lubatschowski, H., Welling, H. & Ertmer, W., 16 Nov 2000, Optical Biopsy and Tissue Optics. SPIE, p. 37-45 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4161).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  11. Published

    Magnetic-field-induced singularities in spin-dependent tunneling through InAs quantum dots

    Hapke-Wurst, I., Zeitler, U., Frahm, H., Jansen, A. G. M., Haug, R. J. & Pierz, K., 15 Nov 2000, In: Physical Review B - Condensed Matter and Materials Physics. 62, 19, p. 12621-12624 4 p.

    Research output: Contribution to journal › Article › Research › peer review

  12. Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide

    Kerr, M., Schmidt, J. & Cuevas, A., 2 Nov 2000, In: Progress in Photovoltaics: Research and Applications. 8, 5, p. 529-536 8 p.

    Research output: Contribution to journal › Article › Research › peer review

  13. Investigation on total scattering at 157 nm and 193 nm

    Kadkhoda, P., Welling, H., Guenster, S. & Ristau, D., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 65-73 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  14. Investigations of transmittance and reflectance in the DUV/VUV spectral range

    Kadkhoda, P., Blaschke, H., Kohlhaas, J. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 311-318 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  15. Microroughness analysis of thin film components for VUV applications

    Ferré-Borrull, J., Duparŕ, A., Steinert, J., Ristau, D. & Quesnel, E., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries: 30 - 31 July 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 82-90 9 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  16. New procedure for the optical characterization of high-quality thin films

    Bosch, S., Leinfellner, N., Quesnel, E., Duparré, A., Ferré-Borrull, J., Günster, S. & Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. 1 ed. Bellingham: SPIE, p. 124-130 7 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  17. Published

    Spatially resolved measurements of electrochemically induced spillover on porous and microstructured Pt/YSZ catalysts

    Imbihl, R. & Janek, J., 2 Nov 2000, In: SOLID STATE IONICS. 136-137, p. 699-705 7 p.

    Research output: Contribution to journal › Article › Research › peer review

  18. Spectrophotometric determination of absorption in the DUV/VUV spectral range for MgF2 and LaF3 thin films

    Guenster, S., Ristau, D. & Bosch-Puig, S., 2 Nov 2000, Optical metrology roadmap for the semiconductor, optical, and data storage industries: 30 - 31 July 2000, San Diego, USA. Bellingham: SPIE, p. 299-310 12 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  19. Standardization in optics characterization

    Ristau, D., 2 Nov 2000, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries. Bellingham: SPIE, p. 91-109 19 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4099).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

  20. Published

    Stepped NaCl films grown epitaxially on Si-precovered vicinal Ge(100)

    Tegenkamp, C., Ernst, W., Eichmann, M. & Pfnür, H., 2 Nov 2000, In: Surface Science. 466, 1-3, p. 41-53 13 p.

    Research output: Contribution to journal › Article › Research › peer review

  21. Micro flame spectrometer

    Zimmermann, S. & Müller, J., Nov 2000, In: Microsystem Technologies. 6, 6, p. 241-245 5 p.

    Research output: Contribution to journal › Article › Research › peer review

  22. Optical characterization of materials deposited by different processes: The LaF3 in the UV-visible region

    Bosch, S., Leinfellner, N., Quesnel, E., Duparre, A., Ferre-Borrull, J., Guenster, S. & Ristau, D., 19 Oct 2000, Optical and Infrared Thin Films: 1 August 2000, San Diego, USA. 1 ed. Bellingham: SPIE, p. 15-22 8 p. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 4094).

    Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

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