Robustness validation of integrated circuits and systems

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • M. Barke
  • M. Kärgel
  • W. Lu
  • F. Salfelder
  • L. Hedrich
  • M. Olbrich
  • M. Radetzki
  • U. Schlichtmann

Research Organisations

External Research Organisations

  • Technical University of Munich (TUM)
  • University of Stuttgart
  • Goethe University Frankfurt
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Details

Original languageEnglish
Title of host publicationProceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012
Pages145-154
Number of pages10
Publication statusPublished - 2012
Event4th Asia Symposium on Quality Electronic Design, ASQED 2012 - Penang, Malaysia
Duration: 10 Jul 201211 Jul 2012

Publication series

NameProceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012

Abstract

Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external. For safety reasons, particular emphasis is placed on robust system design in the automotive and aerospace sectors. Until now, the term robustness has been applied very intuitively and there has been no proper way to actually measure robustness. However, the complexity of contemporary systems makes it difficult to fulfill tight specifications. For this reason, robustness must be integrated into a partially automated design flow. In this paper, a new approach to robustness modeling is presented, in addition to new ways to quantify or assess the robustness of a design. To demonstrate the flexibility of the proposed approach, it is adapted and applied to several different scenarios. These include the robustness evaluation of digital circuits under aging effects, such as NBTI; the robustness modeling of analog and mixed signal circuits using affine arithmetic; and the robustness study of software algorithms on a high system level.

Keywords

    affine arithmetic, aging, analog, digital, NBTI, Robustness, softerrors, system

ASJC Scopus subject areas

Cite this

Robustness validation of integrated circuits and systems. / Barke, M.; Kärgel, M.; Lu, W. et al.
Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. p. 145-154 6320491 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Barke, M, Kärgel, M, Lu, W, Salfelder, F, Hedrich, L, Olbrich, M, Radetzki, M & Schlichtmann, U 2012, Robustness validation of integrated circuits and systems. in Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012., 6320491, Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012, pp. 145-154, 4th Asia Symposium on Quality Electronic Design, ASQED 2012, Penang, Malaysia, 10 Jul 2012. https://doi.org/10.1109/ACQED.2012.6320491
Barke, M., Kärgel, M., Lu, W., Salfelder, F., Hedrich, L., Olbrich, M., Radetzki, M., & Schlichtmann, U. (2012). Robustness validation of integrated circuits and systems. In Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012 (pp. 145-154). Article 6320491 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012). https://doi.org/10.1109/ACQED.2012.6320491
Barke M, Kärgel M, Lu W, Salfelder F, Hedrich L, Olbrich M et al. Robustness validation of integrated circuits and systems. In Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. p. 145-154. 6320491. (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012). doi: 10.1109/ACQED.2012.6320491
Barke, M. ; Kärgel, M. ; Lu, W. et al. / Robustness validation of integrated circuits and systems. Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012. 2012. pp. 145-154 (Proceedings of the 4th Asia Symposium on Quality Electronic Design, ASQED 2012).
Download
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