Robustness measurement of integrated circuits and its adaptation to aging effects.

Research output: Contribution to journal › Article › Research › peer review

Authors

  • Martin Barke
  • Michael Kärgel
  • Markus Olbrich
  • Ulf Schlichtmann

Research Organisations

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Details

Original languageUndefined/Unknown
Pages (from-to)1058-1065
JournalMicroelectron. Reliab.
Volume54
Issue number6-7
Publication statusPublished - 2014

Cite this

Robustness measurement of integrated circuits and its adaptation to aging effects. / Barke, Martin; Kärgel, Michael; Olbrich, Markus et al.
In: Microelectron. Reliab., Vol. 54, No. 6-7, 2014, p. 1058-1065.

Research output: Contribution to journal › Article › Research › peer review

Barke M, Kärgel M, Olbrich M, Schlichtmann U. Robustness measurement of integrated circuits and its adaptation to aging effects. Microelectron. Reliab. 2014;54(6-7):1058-1065. doi: 10.1016/J.MICROREL.2014.01.012
Barke, Martin ; Kärgel, Michael ; Olbrich, Markus et al. / Robustness measurement of integrated circuits and its adaptation to aging effects. In: Microelectron. Reliab. 2014 ; Vol. 54, No. 6-7. pp. 1058-1065.
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