Details
| Original language | English |
|---|---|
| Article number | 055001 |
| Journal | METROLOGIA |
| Volume | 57 |
| Issue number | 5 |
| Publication status | Published - Oct 2020 |
| Externally published | Yes |
Abstract
The traceability of measurements of the parameters characterizing single-photon sources, such as photon flux and optical power, paves the way towards their reliable comparison and quantitative evaluation. In this paper, we present an absolute measurement of the optical power of a single-photon source based on an InGaAs quantum dot under pulsed excitation with a calibrated single-photon avalanche diode (SPAD) detector. For this purpose, a single excitonic line of the quantum dot emission with a bandwidth below 0.1 nm was spectrally filtered by using two tilted interference filters. Since high count rates are essential for many metrological applications, we optimized the setup efficiency by combining high overall transmission of the optical components with a geometrical enhancement of the extraction efficiency of a single quantum dot by a monolithic microlens to reach photon fluxes up to 3.7 · 105 photons per second at the SPADs. A relative calibration of two SPAD detectors with a relative standard uncertainty of 0.7% was carried out and verified by the standard calibration method using an attenuated laser. Finally, an Allan deviation analysis was performed giving an optimal averaging time of 92 s for the photon flux.
Keywords
- quantum dot, quantum metrology, quantum radiometry, single-photon detector, single-photon source
ASJC Scopus subject areas
- Engineering(all)
- General Engineering
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In: METROLOGIA, Vol. 57, No. 5, 055001, 10.2020.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Radiometric characterization of a triggered narrow-bandwidth single-photon source and its use for the calibration of silicon single-photon avalanche detectors
AU - Georgieva, Hristina
AU - López, Marco
AU - Hofer, Helmuth
AU - Christinck, Justus
AU - Rodiek, Beatrice
AU - Schnauber, Peter
AU - Kaganskiy, Arsenty
AU - Heindel, Tobias
AU - Rodt, Sven
AU - Reitzenstein, Stephan
AU - Kück, Stefan
N1 - Publisher Copyright: © 2020 BIPM & IOP Publishing Ltd.
PY - 2020/10
Y1 - 2020/10
N2 - The traceability of measurements of the parameters characterizing single-photon sources, such as photon flux and optical power, paves the way towards their reliable comparison and quantitative evaluation. In this paper, we present an absolute measurement of the optical power of a single-photon source based on an InGaAs quantum dot under pulsed excitation with a calibrated single-photon avalanche diode (SPAD) detector. For this purpose, a single excitonic line of the quantum dot emission with a bandwidth below 0.1 nm was spectrally filtered by using two tilted interference filters. Since high count rates are essential for many metrological applications, we optimized the setup efficiency by combining high overall transmission of the optical components with a geometrical enhancement of the extraction efficiency of a single quantum dot by a monolithic microlens to reach photon fluxes up to 3.7 · 105 photons per second at the SPADs. A relative calibration of two SPAD detectors with a relative standard uncertainty of 0.7% was carried out and verified by the standard calibration method using an attenuated laser. Finally, an Allan deviation analysis was performed giving an optimal averaging time of 92 s for the photon flux.
AB - The traceability of measurements of the parameters characterizing single-photon sources, such as photon flux and optical power, paves the way towards their reliable comparison and quantitative evaluation. In this paper, we present an absolute measurement of the optical power of a single-photon source based on an InGaAs quantum dot under pulsed excitation with a calibrated single-photon avalanche diode (SPAD) detector. For this purpose, a single excitonic line of the quantum dot emission with a bandwidth below 0.1 nm was spectrally filtered by using two tilted interference filters. Since high count rates are essential for many metrological applications, we optimized the setup efficiency by combining high overall transmission of the optical components with a geometrical enhancement of the extraction efficiency of a single quantum dot by a monolithic microlens to reach photon fluxes up to 3.7 · 105 photons per second at the SPADs. A relative calibration of two SPAD detectors with a relative standard uncertainty of 0.7% was carried out and verified by the standard calibration method using an attenuated laser. Finally, an Allan deviation analysis was performed giving an optimal averaging time of 92 s for the photon flux.
KW - quantum dot
KW - quantum metrology
KW - quantum radiometry
KW - single-photon detector
KW - single-photon source
UR - http://www.scopus.com/inward/record.url?scp=85094206034&partnerID=8YFLogxK
U2 - 10.1088/1681-7575/ab9db6
DO - 10.1088/1681-7575/ab9db6
M3 - Article
AN - SCOPUS:85094206034
VL - 57
JO - METROLOGIA
JF - METROLOGIA
SN - 0026-1394
IS - 5
M1 - 055001
ER -