Details
Original language | English |
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Title of host publication | Applied Reconfigurable Computing. Architectures, Tools, and Applications |
Subtitle of host publication | 19th International Symposium, ARC 2023, Proceedings |
Editors | Francesca Palumbo, Georgios Keramidas, Nikolaos Voros, Pedro C. Diniz |
Publisher | Springer Science and Business Media Deutschland GmbH |
Pages | 357-360 |
Number of pages | 4 |
ISBN (print) | 9783031429200 |
Publication status | Published - 16 Sept 2023 |
Event | 19th International Symposium on Applied Reconfigurable Computing, ARC 2023 - Cottbus, Germany Duration: 27 Sept 2023 → 29 Sept 2023 |
Publication series
Name | Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) |
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Volume | 14251 LNCS |
ISSN (Print) | 0302-9743 |
ISSN (electronic) | 1611-3349 |
Abstract
The purpose of this research topic is to investigate the properties of reconfigurable devices (i.e., FPGA) under a radiation environment to finally propose a new methodology to design and evaluate cost-effective radiation hardening measures for reconfigurable devices. As a first step, the radiation hardness of an existing common off-the-shelf reconfigurable hardware device (FPGA) is investigated with regard to different radiation sources, including fast neutron radiation and gamma radiation. Therefore, an experiment is proposed to evaluate in run-time the changes on the memory configuration logic (e.g., configuration of each LUT, routing switches, connection boxes, DSPs,..) and memory user logic (e.g., content of each Block RAM, Flip-Flop, Distributed RAM implemented on LUTs,..). As a result, the chosen FPGA will be modelled in terms of fault probability of each FPGA component for a given radiation environment. These models will be integrated in a new simulation fault injection environment. In a third step, new cost-effective radiation hardening mechanisms, including configuration adjustments, design redundancy, and specialized hardware designs with error detection and correction, will be proposed and evaluated using the previously proposed environment. The proposed radiation hardening mechanisms shall be verified by using real-world radiation sources. The goal is to provide a new methodology for the design of radiation tolerant hardware architecture for FPGA devices.
Keywords
- Fault Injection, FPGA, Radiation Hardness
ASJC Scopus subject areas
- Mathematics(all)
- Theoretical Computer Science
- Computer Science(all)
- General Computer Science
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Applied Reconfigurable Computing. Architectures, Tools, and Applications: 19th International Symposium, ARC 2023, Proceedings. ed. / Francesca Palumbo; Georgios Keramidas; Nikolaos Voros; Pedro C. Diniz. Springer Science and Business Media Deutschland GmbH, 2023. p. 357-360 (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Vol. 14251 LNCS).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Radiation Tolerant Reconfigurable Hardware Architecture Design Methodology
AU - Trumann, Eike
AU - Thieu, Gia Bao
AU - Schmechel, Johannes
AU - Weide-Zaage, Kirsten
AU - Schmidt, Katharina
AU - Hagenah, Dorian
AU - Payá Vayá, Guillermo
PY - 2023/9/16
Y1 - 2023/9/16
N2 - The purpose of this research topic is to investigate the properties of reconfigurable devices (i.e., FPGA) under a radiation environment to finally propose a new methodology to design and evaluate cost-effective radiation hardening measures for reconfigurable devices. As a first step, the radiation hardness of an existing common off-the-shelf reconfigurable hardware device (FPGA) is investigated with regard to different radiation sources, including fast neutron radiation and gamma radiation. Therefore, an experiment is proposed to evaluate in run-time the changes on the memory configuration logic (e.g., configuration of each LUT, routing switches, connection boxes, DSPs,..) and memory user logic (e.g., content of each Block RAM, Flip-Flop, Distributed RAM implemented on LUTs,..). As a result, the chosen FPGA will be modelled in terms of fault probability of each FPGA component for a given radiation environment. These models will be integrated in a new simulation fault injection environment. In a third step, new cost-effective radiation hardening mechanisms, including configuration adjustments, design redundancy, and specialized hardware designs with error detection and correction, will be proposed and evaluated using the previously proposed environment. The proposed radiation hardening mechanisms shall be verified by using real-world radiation sources. The goal is to provide a new methodology for the design of radiation tolerant hardware architecture for FPGA devices.
AB - The purpose of this research topic is to investigate the properties of reconfigurable devices (i.e., FPGA) under a radiation environment to finally propose a new methodology to design and evaluate cost-effective radiation hardening measures for reconfigurable devices. As a first step, the radiation hardness of an existing common off-the-shelf reconfigurable hardware device (FPGA) is investigated with regard to different radiation sources, including fast neutron radiation and gamma radiation. Therefore, an experiment is proposed to evaluate in run-time the changes on the memory configuration logic (e.g., configuration of each LUT, routing switches, connection boxes, DSPs,..) and memory user logic (e.g., content of each Block RAM, Flip-Flop, Distributed RAM implemented on LUTs,..). As a result, the chosen FPGA will be modelled in terms of fault probability of each FPGA component for a given radiation environment. These models will be integrated in a new simulation fault injection environment. In a third step, new cost-effective radiation hardening mechanisms, including configuration adjustments, design redundancy, and specialized hardware designs with error detection and correction, will be proposed and evaluated using the previously proposed environment. The proposed radiation hardening mechanisms shall be verified by using real-world radiation sources. The goal is to provide a new methodology for the design of radiation tolerant hardware architecture for FPGA devices.
KW - Fault Injection
KW - FPGA
KW - Radiation Hardness
UR - http://www.scopus.com/inward/record.url?scp=85174448798&partnerID=8YFLogxK
U2 - 10.1007/978-3-031-42921-7_24
DO - 10.1007/978-3-031-42921-7_24
M3 - Conference contribution
AN - SCOPUS:85174448798
SN - 9783031429200
T3 - Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
SP - 357
EP - 360
BT - Applied Reconfigurable Computing. Architectures, Tools, and Applications
A2 - Palumbo, Francesca
A2 - Keramidas, Georgios
A2 - Voros, Nikolaos
A2 - Diniz, Pedro C.
PB - Springer Science and Business Media Deutschland GmbH
T2 - 19th International Symposium on Applied Reconfigurable Computing, ARC 2023
Y2 - 27 September 2023 through 29 September 2023
ER -