Details
| Original language | English |
|---|---|
| Article number | 110755 |
| Journal | Solar Energy Materials and Solar Cells |
| Volume | 219 |
| Early online date | 7 Sept 2020 |
| Publication status | Published - Jan 2021 |
| Externally published | Yes |
Abstract
High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.
Keywords
- Bifacial PERC, Crystalline silicon, PID Test, Potential-induced degradation, Silicon corrosion, Solar cells
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Energy(all)
- Renewable Energy, Sustainability and the Environment
- Materials Science(all)
- Surfaces, Coatings and Films
Sustainable Development Goals
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In: Solar Energy Materials and Solar Cells, Vol. 219, 110755, 01.2021.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Quick test for reversible and irreversible PID of bifacial PERC solar cells
AU - Sporleder, Kai
AU - Turek, Marko
AU - Schüler, Nadine
AU - Naumann, Volker
AU - Hevisov, David
AU - Pöblau, Clemens
AU - Großer, Stephan
AU - Schulte-Huxel, Henning
AU - Bauer, Jan
AU - Hagendorf, Christian
N1 - Funding information: The authors thank the German Federal Ministry of Education and Research and the German Federal Ministry for Economic Affairs and Energy for financial support of the projects: “PID-Recovery” (project no. 0324184A ), and“NextStep” ( FKZ 0324171B ). Special thanks go to Matthias Schak and Stefan Eiternick for their support at the measurements and sample preparation.
PY - 2021/1
Y1 - 2021/1
N2 - High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.
AB - High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.
KW - Bifacial PERC
KW - Crystalline silicon
KW - PID Test
KW - Potential-induced degradation
KW - Silicon corrosion
KW - Solar cells
UR - http://www.scopus.com/inward/record.url?scp=85090296625&partnerID=8YFLogxK
U2 - 10.1016/j.solmat.2020.110755
DO - 10.1016/j.solmat.2020.110755
M3 - Article
AN - SCOPUS:85090296625
VL - 219
JO - Solar Energy Materials and Solar Cells
JF - Solar Energy Materials and Solar Cells
SN - 0927-0248
M1 - 110755
ER -