Quality control of oblique incidence optical coatings based on normal incidence measurement data

Research output: Contribution to journal › Article › Research › peer review

Authors

  • Tatiana V. Amotchkina
  • Michael K. Trubetskov
  • Alexander V. Tikhonravov
  • Sebastian Schlichting
  • Henrik Ehlers
  • Detlev Ristau
  • David Death
  • Robert J. Francis
  • Vladimir Pervak

Research Organisations

External Research Organisations

  • Lomonosov Moscow State University
  • Max Planck Institute of Quantum Optics (MPQ)
  • Laser Zentrum Hannover e.V. (LZH)
  • Agilent Technologies
  • Ludwig-Maximilians-Universität München (LMU)
  • Ultrafast Innovations GmbH
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Details

Original languageEnglish
Pages (from-to)21508-21522
Number of pages15
JournalOptics Express
Volume21
Issue number18
Publication statusPublished - 9 Sept 2013

Abstract

We demonstrate selection of reliable approaches for postproduction characterization of oblique incidence multilayer optical coatings. The approaches include choice of input information, selection of adequate coating model, corresponding numerical characterization algorithm, and verification of the results. Applications of the approaches are illustrated with post-production characterization of oblique incidence edge filter, oblique incidence beam splitter and oblique incidence 43-layer quarter-wave mirror.

ASJC Scopus subject areas

Cite this

Quality control of oblique incidence optical coatings based on normal incidence measurement data. / Amotchkina, Tatiana V.; Trubetskov, Michael K.; Tikhonravov, Alexander V. et al.
In: Optics Express, Vol. 21, No. 18, 09.09.2013, p. 21508-21522.

Research output: Contribution to journal › Article › Research › peer review

Amotchkina, TV, Trubetskov, MK, Tikhonravov, AV, Schlichting, S, Ehlers, H, Ristau, D, Death, D, Francis, RJ & Pervak, V 2013, 'Quality control of oblique incidence optical coatings based on normal incidence measurement data', Optics Express, vol. 21, no. 18, pp. 21508-21522. https://doi.org/10.1364/OE.21.021508
Amotchkina, T. V., Trubetskov, M. K., Tikhonravov, A. V., Schlichting, S., Ehlers, H., Ristau, D., Death, D., Francis, R. J., & Pervak, V. (2013). Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express, 21(18), 21508-21522. https://doi.org/10.1364/OE.21.021508
Amotchkina TV, Trubetskov MK, Tikhonravov AV, Schlichting S, Ehlers H, Ristau D et al. Quality control of oblique incidence optical coatings based on normal incidence measurement data. Optics Express. 2013 Sept 9;21(18):21508-21522. doi: 10.1364/OE.21.021508
Amotchkina, Tatiana V. ; Trubetskov, Michael K. ; Tikhonravov, Alexander V. et al. / Quality control of oblique incidence optical coatings based on normal incidence measurement data. In: Optics Express. 2013 ; Vol. 21, No. 18. pp. 21508-21522.
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