Properties of fluoride DUV-excimer laser optics: Influence of the number of dielectric layers

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Authors

  • Winfried Arens
  • Detlev Ristau
  • Jens Ullmann
  • Christoph Zaczek
  • Roland Thielsch
  • Norbert Kaiser
  • Angela Duparre
  • Oliver Apel
  • Klaus Mann
  • Hans Lauth
  • Helmut Bernitzki
  • Stefan Schippel
  • H. Heyer
  • Johanes Ebert

External Research Organisations

  • Carl Zeiss SMT GmbH
  • Laser-Laboratorium Göttingen e.V.
  • Fraunhofer Institute for Applied Optics and Precision Engineering (IOF)
  • JENOPTIK Laser GmbH
  • Laseroptik GmbH
  • LAYERTEC GmbH
  • Laser Zentrum Hannover e.V. (LZH)
View graph of relations

Details

Original languageEnglish
Title of host publicationLaser-Induced Damage in Optical Materials: 1999
Subtitle of host publication4 - 7 October 1999, Boulder, Colorado ; proceedings
Place of PublicationBellingham
PublisherSPIE
Pages250-258
Number of pages9
ISBN (print)0-8194-3508-2
Publication statusPublished - 3 Mar 2000
Externally publishedYes
Event31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999' - Boulder, CO, USA
Duration: 4 Oct 19997 Oct 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume3902
ISSN (Print)0277-786X

Abstract

The key technologies for modern production processes with enhanced spatial resolution, require high performance DUV-excimer laser optics with enhanced optical properties. Major challenges imposed onto the requested new generation of optical elements are concentrated on lowest absorption and scattering as well as stability against highest pulse number throughput. These targets are the driving force within the German Joint Research Project `OPUS II', which is dedicated to the development of high quality optical components for the DUV spectral range. As a major contribution to these investigations, sets of reflecting stacks with four different numbers of layer pairs of LaF3/MgF2 were produced by 6 partners of the consortium and characterized in respect to their optical performance and structural properties. The characterization includes spectrophotometric measurements from the VUV up to the mid infrared range, calorimetric absorption measurements at 193 nm, and a comparative study in total scatter behavior at 193 nm, which was performed by three laboratories within the project. Also, besides the intrinsic stress and the surface topography of the layers, the non-linear absorption behavior of selected samples have been determined. The results are presented and discussed with respect to possible applications.

ASJC Scopus subject areas

Cite this

Properties of fluoride DUV-excimer laser optics: Influence of the number of dielectric layers. / Arens, Winfried; Ristau, Detlev; Ullmann, Jens et al.
Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE, 2000. p. 250-258 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902).

Research output: Chapter in book/report/conference proceedingConference contributionResearchpeer review

Arens, W, Ristau, D, Ullmann, J, Zaczek, C, Thielsch, R, Kaiser, N, Duparre, A, Apel, O, Mann, K, Lauth, H, Bernitzki, H, Schippel, S, Heyer, H & Ebert, J 2000, Properties of fluoride DUV-excimer laser optics: Influence of the number of dielectric layers. in Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Proceedings of SPIE - The International Society for Optical Engineering, vol. 3902, SPIE, Bellingham, pp. 250-258, 31st Annual Boulder Damage Symposium: 'Laser-Induced Damage in Optical Materials 1999', Boulder, CO, USA, 4 Oct 1999. https://doi.org/10.1117/12.379314
Arens, W., Ristau, D., Ullmann, J., Zaczek, C., Thielsch, R., Kaiser, N., Duparre, A., Apel, O., Mann, K., Lauth, H., Bernitzki, H., Schippel, S., Heyer, H., & Ebert, J. (2000). Properties of fluoride DUV-excimer laser optics: Influence of the number of dielectric layers. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings (pp. 250-258). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 3902). SPIE. https://doi.org/10.1117/12.379314
Arens W, Ristau D, Ullmann J, Zaczek C, Thielsch R, Kaiser N et al. Properties of fluoride DUV-excimer laser optics: Influence of the number of dielectric layers. In Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham: SPIE. 2000. p. 250-258. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.379314
Arens, Winfried ; Ristau, Detlev ; Ullmann, Jens et al. / Properties of fluoride DUV-excimer laser optics : Influence of the number of dielectric layers. Laser-Induced Damage in Optical Materials: 1999: 4 - 7 October 1999, Boulder, Colorado ; proceedings. Bellingham : SPIE, 2000. pp. 250-258 (Proceedings of SPIE - The International Society for Optical Engineering).
Download
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