Process tomography of ion trap quantum gates

Research output: Contribution to journalArticleResearchpeer review

Authors

  • M. Riebe
  • K. Kim
  • P. Schindler
  • T. Monz
  • Piet Oliver Schmidt
  • T. K. Körber
  • W. Hänsel
  • H. Häffner
  • C. F. Roos
  • R. Blatt

External Research Organisations

  • University of Innsbruck
  • Austrian Academy of Sciences
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Details

Original languageEnglish
Article number220407
JournalPhysical Review Letters
Volume97
Issue number22
Publication statusPublished - 1 Dec 2006
Externally publishedYes

Abstract

A crucial building block for quantum information processing with trapped ions is a controlled-NOT quantum gate. In this Letter, two different sequences of laser pulses implementing such a gate operation are analyzed using quantum process tomography. Fidelities of up to 92.6(6)% are achieved for single-gate operations and up to 83.4(8)% for two concatenated gate operations. By process tomography we assess the performance of the gates for different experimental realizations and demonstrate the advantage of amplitude-shaped laser pulses over simple square pulses. We also investigate whether the performance of concatenated gates can be inferred from the analysis of the single gates.

ASJC Scopus subject areas

Cite this

Process tomography of ion trap quantum gates. / Riebe, M.; Kim, K.; Schindler, P. et al.
In: Physical Review Letters, Vol. 97, No. 22, 220407, 01.12.2006.

Research output: Contribution to journalArticleResearchpeer review

Riebe, M, Kim, K, Schindler, P, Monz, T, Schmidt, PO, Körber, TK, Hänsel, W, Häffner, H, Roos, CF & Blatt, R 2006, 'Process tomography of ion trap quantum gates', Physical Review Letters, vol. 97, no. 22, 220407. https://doi.org/10.1103/PhysRevLett.97.220407
Riebe, M., Kim, K., Schindler, P., Monz, T., Schmidt, P. O., Körber, T. K., Hänsel, W., Häffner, H., Roos, C. F., & Blatt, R. (2006). Process tomography of ion trap quantum gates. Physical Review Letters, 97(22), Article 220407. https://doi.org/10.1103/PhysRevLett.97.220407
Riebe M, Kim K, Schindler P, Monz T, Schmidt PO, Körber TK et al. Process tomography of ion trap quantum gates. Physical Review Letters. 2006 Dec 1;97(22):220407. doi: 10.1103/PhysRevLett.97.220407
Riebe, M. ; Kim, K. ; Schindler, P. et al. / Process tomography of ion trap quantum gates. In: Physical Review Letters. 2006 ; Vol. 97, No. 22.
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