Details
| Original language | English |
|---|---|
| Pages (from-to) | 331-335 |
| Number of pages | 5 |
| Journal | Chemical physics letters |
| Volume | 316 |
| Issue number | 5-6 |
| Publication status | Published - 21 Jan 2000 |
Abstract
Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.
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In: Chemical physics letters, Vol. 316, No. 5-6, 21.01.2000, p. 331-335.
Research output: Contribution to journal › Article › Research › peer review
}
TY - JOUR
T1 - Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface
AU - Luerßen, B.
AU - Günther, S.
AU - Marbach, H.
AU - Kiskinova, M.
AU - Janek, J.
AU - Imbihl, R.
N1 - Funding Information: This work was financially supported by an EC Grant under Contract No. EBRCH-GECT920013 and Sincrotrone Trieste SCpA.
PY - 2000/1/21
Y1 - 2000/1/21
N2 - Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.
AB - Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Å thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.
UR - http://www.scopus.com/inward/record.url?scp=0000969194&partnerID=8YFLogxK
U2 - 10.1016/S0009-2614(99)01302-0
DO - 10.1016/S0009-2614(99)01302-0
M3 - Article
AN - SCOPUS:0000969194
VL - 316
SP - 331
EP - 335
JO - Chemical physics letters
JF - Chemical physics letters
SN - 0009-2614
IS - 5-6
ER -