Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach

Research output: Contribution to conference › Paper › Research

Authors

  • Matthias Becker

Research Organisations

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Details

Original languageEnglish
Pages1817-1823
Publication statusPublished - 2009
EventAsia Pacific Industrial Engineering and Management Systems Conference 2009 - Kitakyushu, Japan
Duration: 4 Dec 2009 → 4 Dec 2009

Conference

ConferenceAsia Pacific Industrial Engineering and Management Systems Conference 2009
Country/TerritoryJapan
Period4 Dec 2009 → 4 Dec 2009

Cite this

Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. / Becker, Matthias.
2009. 1817-1823 Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.

Research output: Contribution to conference › Paper › Research

Becker, M 2009, 'Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach', Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan, 4 Dec 2009 - 4 Dec 2009 pp. 1817-1823.
Becker, M. (2009). Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 1817-1823. Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Becker M. Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 2009. Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Becker, Matthias. / Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
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