Details
Original language | English |
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Pages | 1817-1823 |
Publication status | Published - 2009 |
Event | Asia Pacific Industrial Engineering and Management Systems Conference 2009 - Kitakyushu, Japan Duration: 4 Dec 2009 → 4 Dec 2009 |
Conference
Conference | Asia Pacific Industrial Engineering and Management Systems Conference 2009 |
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Country/Territory | Japan |
Period | 4 Dec 2009 → 4 Dec 2009 |
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Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. / Becker, Matthias.
2009. 1817-1823 Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
2009. 1817-1823 Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Research output: Contribution to conference › Paper › Research
Becker, M 2009, 'Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach', Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan, 4 Dec 2009 - 4 Dec 2009 pp. 1817-1823.
Becker, M. (2009). Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 1817-1823. Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
Becker M. Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach. 2009. Paper presented at Asia Pacific Industrial Engineering and Management Systems Conference 2009, Japan.
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title = "Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach",
author = "Matthias Becker",
year = "2009",
language = "English",
pages = "1817--1823",
note = "Asia Pacific Industrial Engineering and Management Systems Conference 2009 ; Conference date: 04-12-2009 Through 04-12-2009",
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T1 - Performance Efficiency Measuring and Prediction of Wafer Fabrication Operation with a Combined Clustering and Neural Network Approach
AU - Becker, Matthias
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T2 - Asia Pacific Industrial Engineering and Management Systems Conference 2009
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