Oscillator strengths of Ti II from combined hook and emission measurements

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Authors

  • K. Danzmann
  • M. Kock

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Original languageEnglish
Article number012
Pages (from-to)2051-2059
Number of pages9
JournalJournal of Physics B: Atomic and Molecular Physics
Volume13
Issue number10
Publication statusPublished - May 1980

Abstract

It is demonstrated that a large set of accurate oscillator strengths of Ti II can be determined from a combination of hook and emission measurements without any assumption concerning the plasma state. Modified cascaded arcs and hollow cathode discharges have been used as plasma light sources for both hook and emission measurements. The relative f values have been converted to an absolute scale by means of literature data. The overall uncertainties of the f values are about 13-25%. Comparisons with other experimental and theoretical data are made which indicate excellent to fair agreement. Only for one of the published data sets has a wavelength-dependent discrepancy of up to a factor of two been found.

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Oscillator strengths of Ti II from combined hook and emission measurements. / Danzmann, K.; Kock, M.
In: Journal of Physics B: Atomic and Molecular Physics, Vol. 13, No. 10, 012, 05.1980, p. 2051-2059.

Research output: Contribution to journalArticleResearchpeer review

Danzmann K, Kock M. Oscillator strengths of Ti II from combined hook and emission measurements. Journal of Physics B: Atomic and Molecular Physics. 1980 May;13(10):2051-2059. 012. doi: 10.1088/0022-3700/13/10/012
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