Details
| Original language | English |
|---|---|
| Title of host publication | Optical Systems Design 2015 |
| Subtitle of host publication | Optical Fabrication, Testing, and Metrology V |
| Publisher | SPIE |
| ISBN (electronic) | 9781628418170 |
| Publication status | Published - 24 Sept 2015 |
| Externally published | Yes |
| Event | Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Jena, Germany Duration: 7 Sept 2015 → 10 Sept 2015 |
Publication series
| Name | Proceedings of SPIE - The International Society for Optical Engineering |
|---|---|
| Volume | 9628 |
| ISSN (Print) | 0277-786X |
| ISSN (electronic) | 1996-756X |
Abstract
Optical surface quality plays a significant role when considering laser applications. Specifically, short pulses, high pulse energies and shorter wavelength impose high requirements on surface characteristics. Amongst others, scatter losses, absorption, or the damage threshold place high demands on the specification of an optical part, and each application will define the order in priority of these properties. We have conducted several experiments to investigate in the impact of surface characteristics of polished substrates on the performance of coated optics. In this contribution we report on the techniques used to qualify dielectric coatings for excellent power handling capabilities based on the substrate surface finish.
Keywords
- laser-induced damage, subsurface damage, surface roughness
ASJC Scopus subject areas
- Materials Science(all)
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Condensed Matter Physics
- Computer Science(all)
- Computer Science Applications
- Mathematics(all)
- Applied Mathematics
- Engineering(all)
- Electrical and Electronic Engineering
Cite this
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- BibTeX
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Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V. SPIE, 2015. 96280G (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9628).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Optical surfaces for high power laser coatings
AU - Jensen, Lars O.
AU - Ristau, Detlev
PY - 2015/9/24
Y1 - 2015/9/24
N2 - Optical surface quality plays a significant role when considering laser applications. Specifically, short pulses, high pulse energies and shorter wavelength impose high requirements on surface characteristics. Amongst others, scatter losses, absorption, or the damage threshold place high demands on the specification of an optical part, and each application will define the order in priority of these properties. We have conducted several experiments to investigate in the impact of surface characteristics of polished substrates on the performance of coated optics. In this contribution we report on the techniques used to qualify dielectric coatings for excellent power handling capabilities based on the substrate surface finish.
AB - Optical surface quality plays a significant role when considering laser applications. Specifically, short pulses, high pulse energies and shorter wavelength impose high requirements on surface characteristics. Amongst others, scatter losses, absorption, or the damage threshold place high demands on the specification of an optical part, and each application will define the order in priority of these properties. We have conducted several experiments to investigate in the impact of surface characteristics of polished substrates on the performance of coated optics. In this contribution we report on the techniques used to qualify dielectric coatings for excellent power handling capabilities based on the substrate surface finish.
KW - laser-induced damage
KW - subsurface damage
KW - surface roughness
UR - http://www.scopus.com/inward/record.url?scp=84960493118&partnerID=8YFLogxK
U2 - 10.1117/12.2190931
DO - 10.1117/12.2190931
M3 - Conference contribution
AN - SCOPUS:84960493118
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Systems Design 2015
PB - SPIE
T2 - Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Y2 - 7 September 2015 through 10 September 2015
ER -