Details
| Original language | English |
|---|---|
| Title of host publication | 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Proceedings |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 90-94 |
| Number of pages | 5 |
| ISBN (electronic) | 9781728157450 |
| ISBN (print) | 978-1-7281-5744-3, 978-1-7281-5746-7 |
| Publication status | Published - 2020 |
| Event | 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Santa Fe, United States Duration: 29 Mar 2020 → 31 Mar 2020 |
Publication series
| Name | Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation |
|---|---|
| Volume | 2020-March |
Abstract
We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object's roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.
Keywords
- Differentiable Rendering, Optical Measurement, Optimization, Polishing
ASJC Scopus subject areas
- Computer Science(all)
- Software
- Computer Science(all)
- Computer Vision and Pattern Recognition
- Computer Science(all)
- Computer Science Applications
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2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2020. p. 90-94 9094615 (Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation; Vol. 2020-March).
Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review
}
TY - GEN
T1 - Optical Quality Control for Adaptive Polishing Processes
AU - Kassubeck, Marc
AU - Malek, Talash
AU - Muhlhausen, Moritz
AU - Kappel, Moritz
AU - Castillo, Susana
AU - Dittrich, Marc Andre
AU - Magnor, Marcus
N1 - Funding Information: This research has been funded by the Deutsche Forschungsge-meinschaft (DFG, German Research Foundation) under Germany’s Excellence Strategy within the Cluster of Excellence PhoenixD (EXC 2122, Project ID 390833453).
PY - 2020
Y1 - 2020
N2 - We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object's roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.
AB - We propose an image-based method to automatically estimate the surface roughness of a polishing process carried out by a numerically controlled machine tool. Given a single photograph of the workpiece, we incorporate techniques from differentiable rendering to infer the object's roughness parameters, resulting in several advantages over existing approaches: since the method fully accounts for global light transport effects, the estimation can occur under general, known lighting conditions and workpiece geometries. This allows deployment of our approach for in-situ measurements by simply equipping the machine tool with a standard digital camera capturing photos of the workpiece. We investigate the feasibility and effectiveness of our novel method in a prototype application considering polished brass plates. Our results demonstrate a promising direction for surface parameter measurement in less restricted polishing process environments.
KW - Differentiable Rendering
KW - Optical Measurement
KW - Optimization
KW - Polishing
UR - http://www.scopus.com/inward/record.url?scp=85085504139&partnerID=8YFLogxK
U2 - 10.1109/ssiai49293.2020.9094615
DO - 10.1109/ssiai49293.2020.9094615
M3 - Conference contribution
AN - SCOPUS:85085504139
SN - 978-1-7281-5744-3
SN - 978-1-7281-5746-7
T3 - Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation
SP - 90
EP - 94
BT - 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2020
Y2 - 29 March 2020 through 31 March 2020
ER -