Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001)

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Authors

  • Stefan Zollner
  • Victor Vartanian
  • J. P. Liu
  • P. Zaumseil
  • H. J. Osten
  • A. A. Demkov
  • Bich Yen Nguyen

Research Organisations

External Research Organisations

  • Freescale Semiconductor
  • Chartered Semiconductor Manufacturing Ltd.
  • Leibniz Institute for High Performance Microelectronics (IHP)
  • University of Texas at Austin
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Details

Original languageEnglish
Title of host publicationThird International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Publication statusPublished - 2006
EventThird International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States
Duration: 15 May 2006 → 17 May 2006

Publication series

NameThird International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume2006

ASJC Scopus subject areas

Cite this

Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001). / Zollner, Stefan; Vartanian, Victor; Liu, J. P. et al.
Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. 2006. 1715973 (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest; Vol. 2006).

Research output: Chapter in book/report/conference proceeding › Conference contribution › Research › peer review

Zollner, S, Vartanian, V, Liu, JP, Zaumseil, P, Osten, HJ, Demkov, AA & Nguyen, BY 2006, Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001). in Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest., 1715973, Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest, vol. 2006, Third International SiGe Technology and Device Meeting, ISTDM 2006, Princeton, NJ, United States, 15 May 2006.
Zollner, S., Vartanian, V., Liu, J. P., Zaumseil, P., Osten, H. J., Demkov, A. A., & Nguyen, B. Y. (2006). Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001). In Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest Article 1715973 (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest; Vol. 2006).
Zollner S, Vartanian V, Liu JP, Zaumseil P, Osten HJ, Demkov AA et al. Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001). In Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. 2006. 1715973. (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest).
Zollner, Stefan ; Vartanian, Victor ; Liu, J. P. et al. / Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001). Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest. 2006. (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest).
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@inproceedings{b54ee396db2149219a9c548ff9410611,
title = "Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001)",
author = "Stefan Zollner and Victor Vartanian and Liu, {J. P.} and P. Zaumseil and Osten, {H. J.} and Demkov, {A. A.} and Nguyen, {Bich Yen}",
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Download

TY - GEN

T1 - Optical properties, elasto-optical effects, and critical-point parameters of biaxially stressed Si1-yCy alloys on Si (001)

AU - Zollner, Stefan

AU - Vartanian, Victor

AU - Liu, J. P.

AU - Zaumseil, P.

AU - Osten, H. J.

AU - Demkov, A. A.

AU - Nguyen, Bich Yen

PY - 2006

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M3 - Conference contribution

AN - SCOPUS:34247474404

SN - 1424404614

SN - 9781424404612

T3 - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

BT - Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest

T2 - Third International SiGe Technology and Device Meeting, ISTDM 2006

Y2 - 15 May 2006 through 17 May 2006

ER -